Inventor · disambiguated record
Friedrich Passek
Also filed as: PASSEK FRIEDRICH
5 granted patents·2 pending applications·41 citations·filing 2001–2011
76Inventor score
Top patents by PatentIndex Score
7 records- 0188US8088219B2Monocrystalline semiconductor wafer comprising defect-reduced regions and method for producing itKNERER DIETER·Filed 2007·Granted Jan 3, 2012·22 cites·7 claims
- 0288US7828893B2Silicon wafer and process for the heat treatment of a silicon waferSILTRONIC AG·Filed 2006·Granted Nov 9, 2010·15 cites·15 claims
- 0356US7387963B2Semiconductor wafer and process for producing a semiconductor waferSILTRONIC AG·Filed 2006·Granted Jun 17, 2008·2 cites·10 claims
- 0455US8304860B2Epitaxially coated silicon wafer and method for producing an epitaxially coated silicon waferPASSEK FRIEDRICH·Filed 2010·Granted Nov 6, 2012·2 cites·20 claims
- 0547US8216361B2Monocrystalline semiconductor wafer comprising defect-reduced regions and method for producing itKNERER DIETER·Filed 2011·Granted Jul 10, 2012·0 cites·13 claims
- 0629US2001041258A1Standard for a nanotopography unit, and a method for producing the standardWACKER SILTRONIC HALBLEITERMAT·Filed 2001·Application pending·0 cites
- 0729US2012007978A1Method and Apparatus For Examining A Semiconductor WaferPASSEK FRIEDRICH·Filed 2011·Application pending·0 cites
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