Inventor · disambiguated record
Ulrich Kaczynski
Also filed as: KACZYNSKI ULRICH
15 granted patents·314 citations·filing 1988–2004
94Inventor score
Top patents by PatentIndex Score
15 records- 0194US6438856B1Apparatus for fine positioning of a component, and coordinate measuring machine having an apparatus for fine positioning of a componentLEICA MICROSYSTEMS·Filed 2000·Granted Aug 27, 2002·78 cites·24 claims
- 0283US6377870B1Device and method for delivering various transparent substrates into a high-precision measuring instrumentLEICA MICROSYSTEMS·Filed 2000·Granted Apr 23, 2002·31 cites·17 claims
- 0377US6347458B1Displaceable X/Y coordinate measurement tableLEICA MICROSYSTEMS·Filed 1999·Granted Feb 19, 2002·51 cites·28 claims
- 0476US6960755B2Contact sensor, and apparatus for protecting a protruding componentLEICA MICROSYSTEMS·Filed 2002·Granted Nov 1, 2005·18 cites·18 claims
- 0574US6323953B1Method and device for measuring structures on a transparent substrateLEICA MICROSYSTEMS·Filed 1999·Granted Nov 27, 2001·43 cites·38 claims
- 0667US6778260B2Coordinate measuring stage and coordinate measuring instrumentLEICA MICROSYSTEMS·Filed 2002·Granted Aug 17, 2004·9 cites·18 claims
- 0764US6816253B1Substrate holder, and use of the substrate holder in a highly accurate measuring instrumentLEICA MICROSYSTEMS·Filed 2000·Granted Nov 9, 2004·8 cites·21 claims
- 0863US4871290AAutomatic handling apparatus for plate-shaped objectsLEITZ ERNST GMBH·Filed 1988·Granted Oct 3, 1989·34 cites·9 claims
- 0958US7081963B2Substrate holder, and use of the substrate holder in a highly accurate measuring instrumentLEICA MICROSYSTEMS·Filed 2004·Granted Jul 25, 2006·5 cites·7 claims
- 1057US6441899B1Apparatus and method for loading substrates of various sizes into substrate holdersLEICA MICROSYSTEMS·Filed 2000·Granted Aug 27, 2002·6 cites·16 claims
- 1156US6919658B2Coordinate measuring stageLEICA MICROSYSTEMS·Filed 2003·Granted Jul 19, 2005·5 cites·8 claims
- 1253US6816263B2Interferometric measurement apparatus for wavelength calibrationLEICA MICROSYSTEMS·Filed 2002·Granted Nov 9, 2004·4 cites·11 claims
- 1343US6236503B1Microscope stand for a wafer inspection microscopeLEICA MICROSYSTEMS·Filed 1998·Granted May 22, 2001·11 cites·20 claims
- 1442US5315080ALimit switching apparatus with defined overtravel for specimen protection on microscopes with motorized focusing driveLEICA MIKROSKOPIE & SYST·Filed 1992·Granted May 24, 1994·10 cites·8 claims
- 1541US6441911B1Measuring instrument and method for measuring patterns on substrates of various thicknessesLEICA MICROSYSTEMS·Filed 2000·Granted Aug 27, 2002·1 cites·14 claims
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