Inventor · disambiguated record
Hyo Jin Oh
Also filed as: OH HYO JIN
9 granted patents·2 pending applications·62 citations·filing 2000–2019
83Inventor score
Files withUNITEST INC4SAMSUNG ELECTRONICS CO LTD3UNIV SUNGKYUNKWAN RES & BUS2HYUNDAI MOTOR CO LTD1SK HYNIX INC1
Top patents by PatentIndex Score
11 records- 0181US6486651B1Integrated circuit devices having a delay locked loop that is configurable for high-frequency operation during test and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Nov 26, 2002·36 cites·19 claims
- 0276US9171643B2Solid state drive testerUNITEST INC·Filed 2013·Granted Oct 27, 2015·5 cites·8 claims
- 0367US9153345B2Error generating apparatus for solid state drive testerUNITEST INC·Filed 2013·Granted Oct 6, 2015·4 cites·7 claims
- 0467US6788596B2Failed cell address programming circuit and method for programming failed cell addressSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 7, 2004·16 cites·20 claims
- 0560US9245613B2Storage interface apparatus for solid state drive testerUNITEST INC·Filed 2013·Granted Jan 26, 2016·1 cites·5 claims
- 0651US7867437B2Method of manufacture Ni-doped TiO2 nanotube-shaped powder and sheet film comprising the sameHYUNDAI MOTOR CO LTD·Filed 2007·Granted Jan 11, 2011·0 cites·5 claims
- 0739US9371430B2Porous film with high hardness and a low dielectric constant and preparation method thereofUNIV SUNGKYUNKWAN RES & BUS·Filed 2015·Granted Jun 21, 2016·0 cites·20 claims
- 0839US9015545B2Solid state drive testerUNITEST INC·Filed 2013·Granted Apr 21, 2015·0 cites·8 claims
- 0939US2015048487A1Plasma polymerized thin film having high hardness and low dielectric constant and manufacturing method thereofUNIV SUNGKYUNKWAN RES & BUS·Filed 2014·Application pending·0 cites
- 1038US2019341358A1Method of forming semiconductor device using polishing resistance patternSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 1137US10060969B2Test board unit and apparatus for testing a semiconductor chip including the sameSK HYNIX INC·Filed 2015·Granted Aug 28, 2018·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →