Inventor · disambiguated record
Gregory Munson Yeric
Also filed as: YERIC GREGORY M · YERIC GREGORY MUNSON
18 granted patents·2 pending applications·116 citations·filing 1998–2019
92Inventor score
Top patents by PatentIndex Score
20 records- 0197US9978942B2Correlated electron switch structures and applicationsADVANCED RISC MACH LTD·Filed 2016·Granted May 22, 2018·17 cites·11 claims
- 0294US10641953B1Optical waveguide connecting deviceADVANCED RISC MACH LTD·Filed 2018·Granted May 5, 2020·15 cites·13 claims
- 0390US9875332B2Contact resistance mitigationADVANCED RISC MACH LTD·Filed 2015·Granted Jan 23, 2018·8 cites·19 claims
- 0482US10937831B2Correlated electron switch structures and applicationsADVANCED RISC MACH LTD·Filed 2019·Granted Mar 2, 2021·1 cites·20 claims
- 0582US6133093AMethod for forming an integrated circuitMOTOROLA INC·Filed 1998·Granted Oct 17, 2000·48 cites·13 claims
- 0681US9929149B2Using inter-tier vias in integrated circuitsADVANCED RISC MACH LTD·Filed 2016·Granted Mar 27, 2018·4 cites·20 claims
- 0776US7745275B2Integrated circuit and a method of making an integrated circuit to provide a gate contact over a diffusion regionADVANCED RISC MACH LTD·Filed 2008·Granted Jun 29, 2010·7 cites·50 claims
- 0873US10002222B2System and method for perforating redundant metal in self-aligned multiple patterningADVANCED RISC MACH LTD·Filed 2016·Granted Jun 19, 2018·2 cites·20 claims
- 0972US10303840B2Integrated circuit manufacture using direct write lithographyADVANCED RISC MACH LTD·Filed 2017·Granted May 28, 2019·1 cites·8 claims
- 1072US8330478B2Operating parameter monitoring circuit and methodMYERS JAMES EDWARD·Filed 2009·Granted Dec 11, 2012·6 cites·27 claims
- 1167US8154353B2Operating parameter monitor for an integrated circuitYERIC GREGORY MUNSON·Filed 2009·Granted Apr 10, 2012·7 cites·21 claims
- 1261US10446609B2Correlated electron switch structures and applicationsADVANCED RISC MACH LTD·Filed 2018·Granted Oct 15, 2019·0 cites·18 claims
- 1360US12392959B2Optical waveguide connecting deviceADVANCED RISC MACH LTD·Filed 2019·Granted Aug 19, 2025·0 cites·12 claims
- 1457US2020052201A1Controlling dopant concentration in correlated electron materialsADVANCED RISC MACH LTD·Filed 2019·Application pending·0 cites
- 1555US10707415B2Methods and processes for forming devices from correlated electron material (CEM)ADVANCED RISC MACH LTD·Filed 2018·Granted Jul 7, 2020·0 cites·17 claims
- 1654US10454026B2Controlling dopant concentration in correlated electron materialsADVANCED RISC MACH LTD·Filed 2016·Granted Oct 22, 2019·0 cites·18 claims
- 1753US9672316B2Integrated circuit manufacture using direct write lithographyADVANCED RISC MACH LTD·Filed 2013·Granted Jun 6, 2017·0 cites·19 claims
- 1851US2010200996A1Structural feature formation within an integrated circuitADVANCED RISC MACH LTD·Filed 2009·Application pending·0 cites
- 1948US10036774B2Integrated circuit device comprising environment-hardened die and less-environment-hardened dieADVANCED RISC MACH LTD·Filed 2014·Granted Jul 31, 2018·0 cites·19 claims
- 2044US8812997B2Structural feature formation within an integrated circuitYERIC GREGORY MUNSON·Filed 2011·Granted Aug 19, 2014·0 cites·12 claims
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