Inventor · disambiguated record
Yasuhiro Ohnishi
Also filed as: OHNISHI YASUHIRO
19 granted patents·5 pending applications·302 citations·filing 1989–2022
94Inventor score
Files withOMRON TATEISI ELECTRONICS CO13SHIN NIPPON KOKI CO LTD6KUREHA CHEMICAL IND CO LTD1MORI YASUMOTO1NEC CORP1
Top patents by PatentIndex Score
24 records- 0191US8363929B2Shape measurement apparatus and calibration methodOMRON TATEISI ELECTRONICS CO·Filed 2011·Granted Jan 29, 2013·18 cites·11 claims
- 0290US5032211ADevice for controlling tension of tape for use in automatic tape affixing apparatusSHIN NIPPON KOKI CO LTD·Filed 1989·Granted Jul 16, 1991·42 cites·8 claims
- 0390US4997510AAutomatic tape affixing apparatusSHIN NIPPON KOKI CO LTD·Filed 1989·Granted Mar 5, 1991·70 cites·11 claims
- 0485US5011563AAutomatic tape affixing apparatusSHIN NIPPON KOKI CO LTD·Filed 1989·Granted Apr 30, 1991·53 cites·16 claims
- 0579US11321860B2Three-dimensional measurement apparatus, three-dimensional measurement method and non-transitory computer readable mediumOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted May 3, 2022·2 cites·15 claims
- 0677US8334985B2Shape measuring apparatus and shape measuring methodSHO TO·Filed 2010·Granted Dec 18, 2012·8 cites·13 claims
- 0777US5633600AOutput buffer circuit having a minimized output voltage propagationNEC CORP·Filed 1995·Granted May 27, 1997·34 cites·4 claims
- 0875US8615125B2Apparatus and method for inspecting surface stateMORI YASUMOTO·Filed 2010·Granted Dec 24, 2013·6 cites·5 claims
- 0975US4981545AAutomatic tape affixing apparatusSHIN NIPPON KOKI CO LTD·Filed 1989·Granted Jan 1, 1991·31 cites·4 claims
- 1072US8717578B2Profilometer, measuring apparatus, and observing apparatusOHNISHI YASUHIRO·Filed 2010·Granted May 6, 2014·5 cites·19 claims
- 1157US4997508AAutomatic tape affixing apparatusSHIN NIPPON KOKI CO LTD·Filed 1989·Granted Mar 5, 1991·16 cites·12 claims
- 1256US12097627B2Control apparatus for robotic system, control method for robotic system, computer-readable storage medium storing a computer control program, and robotic systemOMRON TATEISI ELECTRONICS CO·Filed 2020·Granted Sep 24, 2024·0 cites·20 claims
- 1350US9752994B2Image processing device, method for controlling same, program, and inspection systemOMRON TATEISI ELECTRONICS CO·Filed 2014·Granted Sep 5, 2017·0 cites·13 claims
- 1450US2024257373A1Information processing system, information processing method, and programOMRON TATEISI ELECTRONICS CO·Filed 2022·Application pending·0 cites
- 1548US11441896B2Inter-reflection detection apparatus and inter-reflection detection methodOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Sep 13, 2022·0 cites·6 claims
- 1646US11302022B2Three-dimensional measurement system and three-dimensional measurement methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Apr 12, 2022·0 cites·12 claims
- 1745US2021197391A1Robot control device, robot control method, and robot control non-transitory computer readable mediumOMRON TATEISI ELECTRONICS CO·Filed 2020·Application pending·0 cites
- 1842US10997738B2Three-dimensional-shape measurement device, three-dimensional-shape measurement method, and programOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted May 4, 2021·0 cites·10 claims
- 1942US5141585AMethod of and apparatus for preventing sidewise deviation of tapeSHIN NIPPON KOKI CO LTD·Filed 1990·Granted Aug 25, 1992·11 cites·8 claims
- 2041US6410613B1Phosphate compound and preparation process thereof, phosphate copper compound and preparation process thereof, near infrared ray absorber, and near infrared ray-absorbing acrylic resin compositionKUREHA CHEMICAL IND CO LTD·Filed 1998·Granted Jun 25, 2002·6 cites·12 claims
- 2141US2011228052A1Three-dimensional measurement apparatus and methodOMRON TATEISI ELECTRONICS CO·Filed 2009·Application pending·0 cites
- 2240US2010259746A1ProfilometerOMRON TATEISI ELECTRONICS CO·Filed 2009·Application pending·0 cites
- 2339US11055863B2Three-dimensional shape measurement device, three-dimensional shape measurement method, and programOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Jul 6, 2021·0 cites·11 claims
- 2435US2015253129A1Inspection apparatusOMRON TATEISI ELECTRONICS CO·Filed 2015·Application pending·0 cites
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