Inventor · disambiguated record
Haohan Wu
Also filed as: WU HAOHAN
9 granted patents·3 pending applications·4 citations·filing 2012–2025
75Inventor score
Top patents by PatentIndex Score
12 records- 0192US12354375B1Multimodal perception decision-making method and apparatus for autonomous driving based on large language modelUNIV BEIJING CHEM TECH·Filed 2025·Granted Jul 8, 2025·2 cites·15 claims
- 0269US8758482B2Methods and compositions for removing carbon dioxide from a gaseous mixtureLI JING·Filed 2012·Granted Jun 24, 2014·2 cites·20 claims
- 0358US2023067182A1Data Processing Device and Method, and Computer Readable Storage MediumBOE TECHNOLOGY GROUP CO LTD·Filed 2019·Application pending·0 cites
- 0447US12066805B2System and method for producing display panels based on nonlinear program model, and non-transitory computer-readable storage mediumBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Aug 20, 2024·0 cites·15 claims
- 0546US11568118B2Electronic device, method for generating package drawing and computer readable storage mediumBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Jan 31, 2023·0 cites·14 claims
- 0644US11703837B2System and method for recommending maximum quantity of work in process, and computer readable mediumBOE TECHNOLOGY GROUP CO LTD·Filed 2019·Granted Jul 18, 2023·0 cites·18 claims
- 0744US2021364999A1System and method for analyzing cause of product defect, computer readable mediumBOE TECHNOLOGY GROUP CO LTD·Filed 2019·Application pending·0 cites
- 0843US12061935B2Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis systemBOE TECHNOLOGY GROUP CO LTD·Filed 2021·Granted Aug 13, 2024·0 cites·11 claims
- 0943US12032364B2Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis systemBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Jul 9, 2024·0 cites·14 claims
- 1039US11809438B2Method and device of detecting fault in productionBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Nov 7, 2023·0 cites·14 claims
- 1137US2022179873A1Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysisBOE TECHNOLOGY GROUP CO LTD·Filed 2021·Application pending·0 cites
- 1236US11797557B2Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysisBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Oct 24, 2023·0 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →