Inventor · disambiguated record
Kazuhiro Koizumi
Also filed as: KOIZUMI KAZUHIRO
17 granted patents·5 pending applications·22 citations·filing 2013–2024
88Inventor score
Top patents by PatentIndex Score
22 records- 0190US10302564B2Water quality analyzerFUJI ELECTRIC CO LTD·Filed 2018·Granted May 28, 2019·4 cites·13 claims
- 0290US9310295B2Laser-type gas analyzerFUJI ELECTRIC CO LTD·Filed 2015·Granted Apr 12, 2016·8 cites·3 claims
- 0385US10302610B2Generation source analyzing device and generation source analyzing methodFUJI ELECTRIC CO LTD·Filed 2017·Granted May 28, 2019·2 cites·18 claims
- 0481US10378416B2Analyzing apparatus and exhaust gas treating systemFUJI ELECTRIC CO LTD·Filed 2016·Granted Aug 13, 2019·4 cites·17 claims
- 0580US10012628B2Multifunctional particle analysis device and method of calibrating the sameFUJI ELECTRIC CO LTD·Filed 2016·Granted Jul 3, 2018·2 cites·20 claims
- 0671US9851292B2Particle detection deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Dec 26, 2017·1 cites·2 claims
- 0771US9671325B2Particle measuring deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jun 6, 2017·1 cites·11 claims
- 0857US2024264195A1Ultrasonic time measurement device, and ultrasonic time measurement methodFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 0954US2025211067A1EncoderFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 1053US2023161337A1Diagnostic device, server, and diagnostic methodFANUC CORP·Filed 2021·Application pending·0 cites
- 1150US11073815B2Collection device, collection method, and collection program that transmit partial data belonging to state data and matching a first condition set in advanceFANUC CORP·Filed 2019·Granted Jul 27, 2021·0 cites·8 claims
- 1247US11362488B2Panelboard deviceFUJI ELECTRIC FA COMPONENTS & SYSTEMS CO LTD·Filed 2019·Granted Jun 14, 2022·0 cites·10 claims
- 1347US10747199B2Operation management deviceFANUC CORP·Filed 2018·Granted Aug 18, 2020·0 cites·7 claims
- 1447US9857282B2Particle analyzing apparatusFUJI ELECTRIC CO LTD·Filed 2016·Granted Jan 2, 2018·0 cites·9 claims
- 1543US11022534B2Generation source analyzing device and generation source analyzing systemFUJI ELECTRIC CO LTD·Filed 2018·Granted Jun 1, 2021·0 cites·12 claims
- 1642US10283337B2Microparticle composition analyzing apparatusFUJI ELECTRIC CO LTD·Filed 2016·Granted May 7, 2019·0 cites·15 claims
- 1741US9574984B2Particle beam forming deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted Feb 21, 2017·0 cites·8 claims
- 1840US2017292903A1Particle component analyzing device, particle multiple-analyzing device and method for using the particle component analyzing deviceFUJI ELECTRIC CO LTD·Filed 2017·Application pending·0 cites
- 1936US10677719B2Gas analyzing apparatusFUJI ELECTRIC CO LTD·Filed 2018·Granted Jun 9, 2020·0 cites·12 claims
- 2036US10061034B2Signal processing device and noise strength determining methodFUJI ELECTRIC CO LTD·Filed 2016·Granted Aug 28, 2018·0 cites·5 claims
- 2136US9983317B2Signal processing device and radiation measurement deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted May 29, 2018·0 cites·8 claims
- 2235US2017154762A1Trap replacement mechanism and microparticle composition analyzing apparatusFUJI ELECTRIC CO LTD·Filed 2016·Application pending·0 cites
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