Inventor · disambiguated record
John S. Smyth
Also filed as: SMYTH JOHN S
6 granted patents·204 citations·filing 2001–2004
86Inventor score
Files withIBM6
Top patents by PatentIndex Score
6 records- 0191US6735492B2Feedback method utilizing lithographic exposure field dimensions to predict process tool overlay settingsIBM·Filed 2002·Granted May 11, 2004·61 cites·32 claims
- 0288US7627622B2System and method of curve fittingIBM·Filed 2004·Granted Dec 1, 2009·80 cites·30 claims
- 0387US6922600B1System and method for optimizing manufacturing processes using real time partitioned process capability analysisIBM·Filed 2004·Granted Jul 26, 2005·31 cites·29 claims
- 0474US6557163B1Method of photolithographic critical dimension control by using reticle measurements in a control algorithmIBM·Filed 2001·Granted Apr 29, 2003·14 cites·20 claims
- 0566US6965808B1System and method for optimizing metrology sampling in APC applicationsIBM·Filed 2004·Granted Nov 15, 2005·12 cites·23 claims
- 0657US7660888B2Indicating network resource availability methods, system and program productIBM·Filed 2004·Granted Feb 9, 2010·6 cites·25 claims
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