Inventor · disambiguated record
Hong-Beom Kim
Also filed as: KIM HONG · KIM HONG-BEOM
13 granted patents·3 pending applications·151 citations·filing 1996–2013
91Inventor score
Top patents by PatentIndex Score
16 records- 0177US6888366B2Apparatus and method for testing a plurality of semiconductor chipsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 3, 2005·25 cites·11 claims
- 0277US6346738B1Fuse option circuit of integrated circuit and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Feb 12, 2002·25 cites·13 claims
- 0369US5914626AVoltage clamping circuit for semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 22, 1999·30 cites·5 claims
- 0467US7634702B2Integrated circuit apparatus having improved test circuit and method of testing the integrated circuit apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Dec 15, 2009·7 cites·16 claims
- 0565US6845407B1Semiconductor memory device having externally controllable data input and output modeSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jan 18, 2005·13 cites·14 claims
- 0652US9526162B2Board assemblySAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Dec 20, 2016·0 cites·22 claims
- 0752US5804883ABonding pad in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 8, 1998·17 cites·7 claims
- 0851US7370237B2Semiconductor memory device capable of accessing all memory cellsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 6, 2008·9 cites·19 claims
- 0951US5983375AMulti-bit test circuit and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Nov 9, 1999·16 cites·25 claims
- 1049US7526688B2Parallel bit testing device and methodSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 28, 2009·2 cites·16 claims
- 1147US8902673B2Method of testing a semiconductor memory deviceKIM HONG-BEOM·Filed 2012·Granted Dec 2, 2014·1 cites·20 claims
- 1240US7139847B2Semiconductor memory device having externally controllable data input and output modeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 21, 2006·2 cites·16 claims
- 1340US6990617B2Semiconductor memory device and test method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 24, 2006·4 cites·17 claims
- 1434US2007047347A1Semiconductor memory devices and a method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1531US2013235685A1Semiconductor memory device and method of screening the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1631US2005083217A1Method for transmitting and receiving signals in semiconductor device and semiconductor device thereofFiled 2004·Application pending·0 cites
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