Inventor · disambiguated record
Hirobumi Inoue
Also filed as: INOUE HIROBUMI
13 granted patents·1 pending application·524 citations·filing 1995–2010
93Inventor score
Top patents by PatentIndex Score
14 records- 0196US6400168B2Method for fabricating probe tip portion composed by coaxial cableNEC CORP·Filed 2001·Granted Jun 4, 2002·116 cites·6 claims
- 0294US6998704B2Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatusNEC CORP·Filed 2003·Granted Feb 14, 2006·86 cites·56 claims
- 0393US6281691B1Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cableNEC CORP·Filed 1999·Granted Aug 28, 2001·119 cites·22 claims
- 0491US6310483B1Longitudinal type high frequency probe for narrow pitched electrodesNEC CORP·Filed 1998·Granted Oct 30, 2001·116 cites·27 claims
- 0582US7321166B2Wiring board having connecting wiring between electrode plane and connecting padNEC CORP·Filed 2005·Granted Jan 22, 2008·14 cites·19 claims
- 0675US6242930B1High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachableNEC CORP·Filed 1998·Granted Jun 5, 2001·41 cites·23 claims
- 0764US7434190B2Analysis method and analysis apparatus of designing transmission lines of an integrated circuit packaging boardNEC CORP·Filed 2006·Granted Oct 7, 2008·3 cites·18 claims
- 0860US9283812B2Pneumatic radial tire for heavy loadsINOUE HIROBUMI·Filed 2010·Granted Mar 15, 2016·1 cites·8 claims
- 0957US6486688B2Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristicsNEC CORP·Filed 2001·Granted Nov 26, 2002·8 cites·38 claims
- 1054US6433410B2Semiconductor device tester and method of testing semiconductor deviceNEC CORP·Filed 2001·Granted Aug 13, 2002·6 cites·14 claims
- 1149US7594644B2Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatusNEC CORP·Filed 2005·Granted Sep 29, 2009·0 cites·19 claims
- 1242US5614944ATest method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generatorNEC CORP·Filed 1995·Granted Mar 25, 1997·10 cites·50 claims
- 1342US2010032198A1Circuit moduleINOUE HIROBUMI·Filed 2008·Application pending·0 cites
- 1433US6229321B1Process for manufacturing high frequency multichip module enabling independent test of bare chipNEC CORP·Filed 1999·Granted May 8, 2001·4 cites·9 claims
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