Inventor · disambiguated record
Philippe Leray
Also filed as: LERAY PHILIPPE
4 granted patents·1 pending application·5 citations·filing 2016–2022
61Inventor score
Top patents by PatentIndex Score
5 records- 0183US10732124B2Methods for detecting defects of a lithographic patternIMEC VZW·Filed 2018·Granted Aug 4, 2020·3 cites·15 claims
- 0270US10061209B2Method for verifying a pattern of features printed by a lithography processIMEC VZW·Filed 2016·Granted Aug 28, 2018·2 cites·14 claims
- 0350US2024198506A1Method for monitoring the quality of screwing or drilling operations including unsupervised machine learningRENAULT GEORGES ETS·Filed 2022·Application pending·0 cites
- 0442US9983154B2Method for inspecting a pattern of features on a semiconductor dieIMEC VZW·Filed 2016·Granted May 29, 2018·0 cites·20 claims
- 0533US9874821B2Method for hotspot detection and ranking of a lithographic maskIMEC VZW·Filed 2016·Granted Jan 23, 2018·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →