Inventor · disambiguated record
Rintaro Nakatani
Also filed as: NAKATANI RINTARO
14 granted patents·2 pending applications·94 citations·filing 1989–2012
90Inventor score
Top patents by PatentIndex Score
16 records- 0188US8891729B2X-ray analyzer and X-ray analysis methodMATOBA YOSHIKI·Filed 2012·Granted Nov 18, 2014·8 cites·3 claims
- 0272US7641384B2Thermal analysis system and method of drying the sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Jan 5, 2010·3 cites·8 claims
- 0367US6146012ADifferential thermal analyzerSEIKO INSTR INC·Filed 1999·Granted Nov 14, 2000·31 cites·16 claims
- 0466US7744273B2Thermal analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Jun 29, 2010·2 cites·3 claims
- 0565US7275862B2Differential scanning calorimeter with a second heaterSII NANOTECHNOLOGY INC·Filed 2004·Granted Oct 2, 2007·5 cites·7 claims
- 0661US6402370B1Thermal analysis apparatusSEIKO INSTR INC·Filed 2000·Granted Jun 11, 2002·4 cites·28 claims
- 0754US6911979B2Derived data display adjustment systemSII NANOTECHNOLOGY INC·Filed 2001·Granted Jun 28, 2005·6 cites·3 claims
- 0846US5228778AHeat analyzerSEIKO INSTR INC·Filed 1992·Granted Jul 20, 1993·13 cites·7 claims
- 0943US7748894B2Thermal analysis equipmentSII NANOTECHNOLOGY INC·Filed 2005·Granted Jul 6, 2010·0 cites·19 claims
- 1041US5379239AWaveform display deviceSEIKO INSTR INC·Filed 1991·Granted Jan 3, 1995·14 cites·3 claims
- 1140US2002080150A1Graphical display adjusting systemFiled 2001·Application pending·0 cites
- 1236US2002004896A1Analyzer systemFiled 2001·Application pending·0 cites
- 1333US6709153B2Thermogravimetry apparatusSII NANOTECHNOLOGY INC·Filed 2002·Granted Mar 23, 2004·0 cites·8 claims
- 1433US5448504AApparatus for thermal analysisSEIKO INSTR INC·Filed 1993·Granted Sep 5, 1995·5 cites·14 claims
- 1530US5309171AGraph display deviceSEIKO INSTR INC·Filed 1989·Granted May 3, 1994·3 cites·6 claims
- 1628US6542084B1Thermal analyzerSEIKO INSTR INC·Filed 1998·Granted Apr 1, 2003·0 cites·27 claims
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