Inventor · disambiguated record
Yoshiki Matoba
Also filed as: MATOBA YOSHIKI
33 granted patents·2 pending applications·266 citations·filing 2001–2024
97Inventor score
Files withSII NANOTECHNOLOGY INC14HITACHI HIGH TECH SCIENCE CORP13MATOBA YOSHIKI5SEIKO INSTR INC2HITACHI HIGH TECH CORP1
Top patents by PatentIndex Score
35 records- 0194US8000439B2X-ray analyzer and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2009·Granted Aug 16, 2011·22 cites·5 claims
- 0293US7627088B2X-ray tube and X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Dec 1, 2009·20 cites·5 claims
- 0392US9213007B2Foreign matter detectorHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Dec 15, 2015·10 cites·5 claims
- 0492US7970101B2X-ray analyzer and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2009·Granted Jun 28, 2011·23 cites·8 claims
- 0592US7680248B2X-ray tube and X-ray analyzing apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Mar 16, 2010·16 cites·12 claims
- 0691US10823686B2X-ray inspection method and X-ray inspection deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Nov 3, 2020·5 cites·16 claims
- 0791US9863896B2X-ray transmission inspection apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Jan 9, 2018·5 cites·6 claims
- 0891US7436926B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Oct 14, 2008·19 cites·16 claims
- 0989US11022570B2X-ray transmission inspection apparatus and X-ray transmission inspection methodHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Jun 1, 2021·3 cites·8 claims
- 1089US7634053B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Dec 15, 2009·14 cites·11 claims
- 1189US7587025B2X-ray analysis apparatus and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2008·Granted Sep 8, 2009·16 cites·6 claims
- 1289US7428293B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Sep 23, 2008·16 cites·15 claims
- 1388US8891729B2X-ray analyzer and X-ray analysis methodMATOBA YOSHIKI·Filed 2012·Granted Nov 18, 2014·8 cites·3 claims
- 1488US7634054B2X-ray tube and X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Dec 15, 2009·12 cites·6 claims
- 1588US7424093B2Fluorescent x-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Sep 9, 2008·14 cites·11 claims
- 1687US9188553B2X-ray fluorescence analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Nov 17, 2015·7 cites·3 claims
- 1783US9001966B2Transmission X-ray analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Apr 7, 2015·4 cites·2 claims
- 1882US9410906B2X-ray fluorescence spectrometer comprising a temperature sensor, two external-air fans, and a circulation fanHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Aug 9, 2016·4 cites·8 claims
- 1982US8912503B2Transmission X-ray analyzer and transmission X-ray analysis methodMATOBA YOSHIKI·Filed 2012·Granted Dec 16, 2014·4 cites·10 claims
- 2082US8422630B2X-ray inspection device and X-ray inspection methodMATOBA YOSHIKI·Filed 2010·Granted Apr 16, 2013·4 cites·8 claims
- 2179US8068583B2X-ray analysis apparatus and X-ray analysis methodMATOBA YOSHIKI·Filed 2009·Granted Nov 29, 2011·7 cites·10 claims
- 2279US7289598B2X-ray fluorescent analysis apparatusSII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 30, 2007·6 cites·8 claims
- 2375US8596866B2X-ray transmission inspection apparatus and x-ray transmission inspection methodMATOBA YOSHIKI·Filed 2011·Granted Dec 3, 2013·2 cites·16 claims
- 2474US2024297316A1Hydrogen impurity testing system and hydrogen impurity testing methodHITACHI HIGH TECH SCIENCE CORP·Filed 2024·Application pending·0 cites
- 2572US7529337B2Energy dispersion type radiation detecting system and method of measuring content of object elementSII NANOTECHNOLOGY INC·Filed 2007·Granted May 5, 2009·3 cites·16 claims
- 2671US10054555B2X-ray transmission inspection apparatus and inspection method using the sameHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Aug 21, 2018·3 cites·4 claims
- 2771US9400255B2X-ray fluorescence spectrometer comprising a gas blowing mechanismHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Jul 26, 2016·2 cites·8 claims
- 2870US7623627B2X-ray analysis apparatus and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2009·Granted Nov 24, 2009·2 cites·6 claims
- 2966US6590955B2Open chamber-type X-ray analysis apparatusSEIKO INSTR INC·Filed 2001·Granted Jul 8, 2003·6 cites·4 claims
- 3060US10847355B2Mass analysis apparatus and methodHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Nov 24, 2020·0 cites·8 claims
- 3157US7022996B2Radiation detectorSII NANOTECHNOLOGY INC·Filed 2003·Granted Apr 4, 2006·6 cites·4 claims
- 3256US10636638B2Mass analysis apparatus and methodHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Apr 28, 2020·0 cites·1 claims
- 3351US6496565B2X-ray fluorescence analysis apparatusSEIKO INSTR INC·Filed 2001·Granted Dec 17, 2002·3 cites·20 claims
- 3449US10651018B2Apparatus for and method of mass analysisHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted May 12, 2020·0 cites·7 claims
- 3535US2016041110A1X-ray transmission inspection apparatus and extraneous substance detecting methodHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →