Inventor · disambiguated record
Kyoji Yamasaki
Also filed as: YAMASAKI KYOJI
30 granted patents·1 pending application·807 citations·filing 1992–2016
98Inventor score
Files withMITSUBISHI ELECTRIC CORP24RENESAS TECH CORP4RENESAS ELECTRONICS CORP2MITSUBIHSI DENKI KABUSHIKI KAI1
Top patents by PatentIndex Score
31 records- 0196US6285622B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 4, 2001·142 cites·14 claims
- 0291US6519194B2Semiconductor memory device with a rapid packet data input, capable of operation check with low speed testerMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Feb 11, 2003·61 cites·3 claims
- 0388US6339357B1Semiconductor integrated circuit device capable of externally monitoring internal voltageMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 15, 2002·62 cites·17 claims
- 0486US6433422B1Semiconductor integrated circuit having semiconductor packages for mounting integrated circuit chips on both sides of a substrateMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 13, 2002·90 cites·20 claims
- 0584US6594167B1Semiconductor integrated circuit having a structure for equalizing interconnection lengths and memory module provided with the semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 15, 2003·36 cites·14 claims
- 0682US6404687B2Semiconductor integrated circuit having a self-refresh functionMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jun 11, 2002·32 cites·8 claims
- 0780US6809576B1Semiconductor integrated circuit device having two types of internal power supply circuitsRENESAS TECH CORP·Filed 1998·Granted Oct 26, 2004·36 cites·10 claims
- 0874US6301190B1Semiconductor memory device with a rapid packet data input, capable of operation check with low speed testerMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 9, 2001·19 cites·5 claims
- 0972US6631092B2Semiconductor memory device capable of imposing large stress on transistorMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Oct 7, 2003·19 cites·3 claims
- 1072US5757175AConstant current generating circuitMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 26, 1998·27 cites·20 claims
- 1171US6065143ASemiconductor memory device capable of fast testing without externally considering address scramble or data scrambleMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 16, 2000·39 cites·15 claims
- 1271US5859799ASemiconductor memory device including internal power supply circuit generating a plurality of internal power supply voltages at different levelsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jan 12, 1999·32 cites·6 claims
- 1371US5716889AMethod of arranging alignment marksMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 10, 1998·40 cites·3 claims
- 1470US7161387B2Semiconductor device and level conversion circuitRENESAS TECH CORP·Filed 2004·Granted Jan 9, 2007·12 cites·12 claims
- 1570US6661729B2Semiconductor device having test modeRENESAS TECH CORP·Filed 2002·Granted Dec 9, 2003·15 cites·5 claims
- 1667US7288965B2Semiconductor device and level conversion circuitRENESAS TECH CORP·Filed 2006·Granted Oct 30, 2007·4 cites·2 claims
- 1766US6330173B1Semiconductor integrated circuit comprising step-up voltage generation circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 11, 2001·20 cites·22 claims
- 1864US6486731B2Semiconductor integrated circuit device capable of externally monitoring internal voltageMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Nov 26, 2002·11 cites·14 claims
- 1961US6498760B2Semiconductor device having test modeMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 24, 2002·10 cites·8 claims
- 2060US5789808ASemiconductor device structured to be less susceptible to power supply noiseMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Aug 4, 1998·19 cites·1 claims
- 2155US5291454ACircuit for decreasing current consumption in data output circuit in case one of two supply voltages failsMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Mar 1, 1994·16 cites·8 claims
- 2249US5973554ASemiconductor device structured to be less susceptible to power supply noiseMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 26, 1999·11 cites·2 claims
- 2348US6005294AMethod of arranging alignment marksMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Dec 21, 1999·15 cites·9 claims
- 2446US5875145ASemiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operationMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Feb 23, 1999·8 cites·19 claims
- 2545US5978299ASemiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operationMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 2, 1999·8 cites·1 claims
- 2643US6147398ASemiconductor device packageMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Nov 14, 2000·16 cites·15 claims
- 2739US6657879B2Semiconductor integrated circuit device with noise filterMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 2, 2003·2 cites·9 claims
- 2838US6064557ASemiconductor device structured to be less susceptible to power supply noiseMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 16, 2000·5 cites·2 claims
- 2937US9888192B2Imaging deviceRENESAS ELECTRONICS CORP·Filed 2016·Granted Feb 6, 2018·0 cites·15 claims
- 3035US2017077166A1Image sensor deviceRENESAS ELECTRONICS CORP·Filed 2016·Application pending·0 cites
- 3124US6166966ASemiconductor memory device including data output circuit capable of high speed data outputMITSUBIHSI DENKI KABUSHIKI KAI·Filed 2000·Granted Dec 26, 2000·0 cites·10 claims
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