Inventor · disambiguated record
Yun Kyoung Lee
Also filed as: LEE YUN KYOUNG
12 granted patents·1 pending application·21 citations·filing 2011–2016
85Inventor score
Top patents by PatentIndex Score
13 records- 0192US9520403B2Semiconductor memory deviceSK HYNIX INC·Filed 2015·Granted Dec 13, 2016·8 cites·12 claims
- 0281US9318201B2Semiconductor memory device including three-dimensional array structureSK HYNIX INC·Filed 2014·Granted Apr 19, 2016·6 cites·20 claims
- 0372US8921182B2Method for fabricating 3D nonvolatile memory device with vertical channel holeJUNG SUNG-WOOK·Filed 2012·Granted Dec 30, 2014·4 cites·7 claims
- 0468US9633731B2Semiconductor memory device including three-dimensional array structureSK HYNIX INC·Filed 2016·Granted Apr 25, 2017·1 cites·9 claims
- 0568US9274939B2Memory systemSK HYNIX INC·Filed 2013·Granted Mar 1, 2016·2 cites·18 claims
- 0653US9041124B2Semiconductor memory device and method of manufacturing the sameSK HYNIX INC·Filed 2012·Granted May 26, 2015·0 cites·7 claims
- 0751US9117699B2Semiconductor memory deviceSK HYNIX INC·Filed 2013·Granted Aug 25, 2015·0 cites·22 claims
- 0850US9136269B2Semiconductor device and method of manufacturing the sameSK HYNIX INC·Filed 2014·Granted Sep 15, 2015·0 cites·5 claims
- 0949US8546788B2Nonvolatile memory device having dielectric layer formed on control gate sidewall along lateral directionHYNIX SEMICONDUCTOR INC·Filed 2012·Granted Oct 1, 2013·0 cites·8 claims
- 1048US8901629B2Semiconductor device and method of manufacturing the sameAHN JUNG RYUL·Filed 2012·Granted Dec 2, 2014·0 cites·14 claims
- 1147US10115809B2Semiconductor memory device and method of manufacturing the sameSK HYNIX INC·Filed 2015·Granted Oct 30, 2018·0 cites·10 claims
- 1240US2013146962A1Semiconductor device and method of manufacturing the sameAHN JUNG RYUL·Filed 2012·Application pending·0 cites
- 1338US8318591B2Nonvolatile memory device with dielectric layer formed on control gate sidewall along lateral directionLEE YUN KYOUNG·Filed 2011·Granted Nov 27, 2012·0 cites·12 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →