Inventor · disambiguated record
Akitoshi Kawai
Also filed as: KAWAI AKITOSHI
8 granted patents·1 pending application·26 citations·filing 1999–2019
81Inventor score
Top patents by PatentIndex Score
9 records- 0186US10557706B2Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection programNIKON CORP·Filed 2017·Granted Feb 11, 2020·3 cites·34 claims
- 0284US10760902B2Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection programNIKON CORP·Filed 2018·Granted Sep 1, 2020·2 cites·12 claims
- 0371US8730465B2Polarized light defect detection in pupil imagesENDO KAZUMASA·Filed 2008·Granted May 20, 2014·5 cites·19 claims
- 0470US11016038B2Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structureNIKON CORP·Filed 2014·Granted May 25, 2021·1 cites·35 claims
- 0565US11016039B2Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structureNIKON CORP·Filed 2018·Granted May 25, 2021·0 cites·16 claims
- 0661US10809209B2Measurement processing device, x-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing methodNIKON CORP·Filed 2019·Granted Oct 20, 2020·0 cites·10 claims
- 0755US10481106B2Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing methodNIKON CORP·Filed 2017·Granted Nov 19, 2019·0 cites·20 claims
- 0845US6405610B1Wafer inspection apparatusNIKON CORP·Filed 1999·Granted Jun 18, 2002·15 cites·6 claims
- 0944US2008285840A1Defect inspection apparatus performing defect inspection by image analysisNIKON CORP·Filed 2008·Application pending·0 cites
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