Inventor · disambiguated record
Takio Ohno
Also filed as: OHNO TAKIO
7 granted patents·2 pending applications·183 citations·filing 1995–2008
86Inventor score
Top patents by PatentIndex Score
9 records- 0179US5880503ASemiconductor integrated circuit device having static memory cell with CMOS structureMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Mar 9, 1999·64 cites·8 claims
- 0276US5621232ASemiconductor device including a local interconnection between an interconnection layer and an adjoining impurity regionMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Apr 15, 1997·58 cites·8 claims
- 0363US6069400ASemiconductor device and method of fabricating the sameMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 30, 2000·30 cites·12 claims
- 0457US5773347AMethod of maufacturing field effect transistorMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 30, 1998·23 cites·3 claims
- 0550US7180153B2Capture of residual refractory metal within semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Feb 20, 2007·4 cites·11 claims
- 0649US2008272461A1Capture of residual refractory metal within semiconductor deviceRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 0748US7408239B2Capture of residual refractory metal within semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Aug 5, 2008·0 cites·11 claims
- 0844US2004219753A1Method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2003·Application pending·0 cites
- 0933US6777772B1Semiconductor device having improved trench structureRENESAS TECH CORP·Filed 1998·Granted Aug 17, 2004·4 cites·8 claims
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