Inventor · disambiguated record
Takeshi Kamino
Also filed as: KAMINO TAKESHI
15 granted patents·3 pending applications·16 citations·filing 2001–2019
88Inventor score
Top patents by PatentIndex Score
18 records- 0185US9331114B2Image pickup device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2013·Granted May 3, 2016·3 cites·20 claims
- 0282US10020345B2Method for manufacturing image capturing device and image capturing deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Jul 10, 2018·2 cites·17 claims
- 0381US9806126B2Method for manufacturing image capturing device and image capturing deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Oct 31, 2017·2 cites·10 claims
- 0475US9576993B2Method for manufacturing image capturing device and image capturing deviceRENESAS ELECTRONICS CORP·Filed 2012·Granted Feb 21, 2017·2 cites·12 claims
- 0574US10978505B2Solid-state imaging device including a sensor substrate and a logic substrateRENESAS ELECTRONICS CORP·Filed 2019·Granted Apr 13, 2021·2 cites·11 claims
- 0668US2015076566A1Semiconductor device and a manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 0765US10559623B2Method for manufacturing image capturing device and image capturing deviceRENESAS ELECTRONICS CORP·Filed 2019·Granted Feb 11, 2020·0 cites·14 claims
- 0863US10566367B2Semiconductor device and a manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2018·Granted Feb 18, 2020·1 cites·7 claims
- 0962US10319779B2Method for manufacturing image capturing device and image capturing deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Jun 11, 2019·0 cites·15 claims
- 1055US2016079294A1Image pickup device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 1150US7180153B2Capture of residual refractory metal within semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Feb 20, 2007·4 cites·11 claims
- 1249US2008272461A1Capture of residual refractory metal within semiconductor deviceRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 1348US10056420B2Semiconductor device and manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2016·Granted Aug 21, 2018·0 cites·5 claims
- 1448US7408239B2Capture of residual refractory metal within semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Aug 5, 2008·0 cites·11 claims
- 1547US10026775B2Method of manufacturing semiconductor device utilizing different mask thicknesses to form gate electrodes over different semiconductor regionsRENESAS ELECTRONICS CORP·Filed 2016·Granted Jul 17, 2018·0 cites·11 claims
- 1646US9564466B2Semiconductor device and manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2015·Granted Feb 7, 2017·0 cites·8 claims
- 1744US10504950B2Solid-state imaging device and its manufacturing methodRENESAS ELECTRONICS CORP·Filed 2018·Granted Dec 10, 2019·0 cites·10 claims
- 1839US10115751B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2016·Granted Oct 30, 2018·0 cites·20 claims
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