Inventor · disambiguated record
Toshihide Agemura
Also filed as: AGEMURA TOSHIHIDE
36 granted patents·8 pending applications·153 citations·filing 2005–2021
96Inventor score
Files withHITACHI HIGH TECH CORP34AGEMURA TOSHIHIDE3NOMAGUCHI TSUNENORI3ASAI SUYO1HITACHI HIGH-TECNOLOGIES CORP1
Top patents by PatentIndex Score
44 records- 0198US7582885B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 1, 2009·61 cites·5 claims
- 0295US7615765B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 10, 2009·23 cites·20 claims
- 0391US7112792B2Defect inspection and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 26, 2006·16 cites·16 claims
- 0485US7550724B2Electron beam device and its control methodHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 23, 2009·9 cites·8 claims
- 0585US7348559B2Defect inspection and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 25, 2008·6 cites·18 claims
- 0684US9761409B2Composite charged particle detector, charged particle beam device, and charged particle detectorHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 12, 2017·5 cites·9 claims
- 0783US11251011B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 15, 2022·3 cites·8 claims
- 0882US8026491B2Charged particle beam apparatus and method for charged particle beam adjustmentHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 27, 2011·9 cites·5 claims
- 0981US8304723B2Defect inspection and charged particle beam apparatusAGEMURA TOSHIHIDE·Filed 2010·Granted Nov 6, 2012·4 cites·7 claims
- 1078US11393657B2Electron beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 19, 2022·2 cites·15 claims
- 1177US10872744B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 22, 2020·3 cites·10 claims
- 1277US10014151B2Composite charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 3, 2018·2 cites·15 claims
- 1370US10886101B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 5, 2021·1 cites·10 claims
- 1470US9536703B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 3, 2017·2 cites·19 claims
- 1568US11043358B2Measuring apparatus and method of setting observation conditionHITACHI HIGH TECH CORP·Filed 2017·Granted Jun 22, 2021·1 cites·17 claims
- 1667US10249471B2Composite charged particle beam apparatus and control method thereofHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 2, 2019·1 cites·18 claims
- 1767US8455820B2Composite charged particle beams apparatusAGEMURA TOSHIHIDE·Filed 2010·Granted Jun 4, 2013·2 cites·37 claims
- 1863US8610060B2Charged particle beam deviceASAI SUYO·Filed 2009·Granted Dec 17, 2013·3 cites·6 claims
- 1961US7705303B2Defect inspection and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 27, 2010·0 cites·9 claims
- 2056US10128081B2Composite charged particle beam detector, charged particle beam device, and charged particle beam detectorHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 13, 2018·0 cites·9 claims
- 2156US9478389B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 25, 2016·0 cites·7 claims
- 2254US12334297B2Electron gun and electron beam application deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 17, 2025·0 cites·14 claims
- 2352US11784022B2Electron beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 10, 2023·0 cites·8 claims
- 2451US11139143B2Spin polarimeterHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 5, 2021·0 cites·13 claims
- 2550US12217928B2Electron gun and electron microscopeHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 4, 2025·0 cites·14 claims
- 2650US10297416B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted May 21, 2019·0 cites·19 claims
- 2750US9355814B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted May 31, 2016·0 cites·18 claims
- 2850US2024128049A1Electron microscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2949US12165828B2Electron gun and electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 10, 2024·0 cites·11 claims
- 3048US2024161997A1Electron beam application deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3145US11107656B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 31, 2021·0 cites·12 claims
- 3244US11189457B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 30, 2021·0 cites·15 claims
- 3343US11610754B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 21, 2023·0 cites·15 claims
- 3443US9966218B2Electron beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted May 8, 2018·0 cites·20 claims
- 3543US8680465B2Charged particle beam apparatus and film thickness measurement methodTOMIMATSU SATOSHI·Filed 2010·Granted Mar 25, 2014·0 cites·26 claims
- 3643US2016379797A1Charged Particle Beam ApparatusHITACHI HIGH-TECNOLOGIES CORP·Filed 2014·Application pending·0 cites
- 3741US10453648B2Charged particle bean device and information-processing deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 22, 2019·0 cites·15 claims
- 3841US2014175279A1Charged particle beam apparatusAGEMURA TOSHIHIDE·Filed 2012·Application pending·0 cites
- 3937US11183362B2Charged particle beam apparatus and sample observation method using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 23, 2021·0 cites·11 claims
- 4037US8581219B2Composite charged-particle-beam apparatusNOMAGUCHI TSUNENORI·Filed 2011·Granted Nov 12, 2013·0 cites·6 claims
- 4135US2013277552A1Charged particle beam device and method of manufacture of sampleNANRI TERUTAKA·Filed 2011·Application pending·0 cites
- 4235US2014123898A1Charged particle beam deviceNOMAGUCHI TSUNENORI·Filed 2012·Application pending·0 cites
- 4334US2013248733A1Charged particle beam apparatus and method of irradiating charged particle beamNOMAGUCHI TSUNENORI·Filed 2011·Application pending·0 cites
- 4431US2019385810A1Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2017·Application pending·0 cites
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