Inventor · disambiguated record
Hideo Morishita
Also filed as: MORISHITA HIDEO
21 granted patents·7 pending applications·47 citations·filing 2006–2022
91Inventor score
Top patents by PatentIndex Score
28 records- 0190US9029766B2Scanning electron microscopeMORISHITA HIDEO·Filed 2012·Granted May 12, 2015·15 cites·14 claims
- 0287US8629395B2Charged particle beam apparatusMORISHITA HIDEO·Filed 2011·Granted Jan 14, 2014·10 cites·17 claims
- 0385US9570268B2Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gunHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 14, 2017·6 cites·15 claims
- 0483US10241062B2Charged particle beam device, sample observation method, sample platform, observation system, and light emitting memberHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 26, 2019·4 cites·23 claims
- 0580US11170972B2Scanning electron microscope and method for analyzing secondary electron spin polarizationHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 9, 2021·2 cites·15 claims
- 0677US10014151B2Composite charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 3, 2018·2 cites·15 claims
- 0775US9812288B2Sample holder with light emitting and transferring elements for a charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 7, 2017·2 cites·18 claims
- 0872US9208994B2Electron beam apparatus for visualizing a displacement of an electric fieldOHSHIMA TAKASHI·Filed 2011·Granted Dec 8, 2015·3 cites·17 claims
- 0970US10886101B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 5, 2021·1 cites·10 claims
- 1070US9536703B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 3, 2017·2 cites·19 claims
- 1161US11756763B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·13 claims
- 1259US12400827B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 26, 2025·0 cites·18 claims
- 1355US2025349493A1Electron microscope and image capturing method thereofHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1454US12334297B2Electron gun and electron beam application deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 17, 2025·0 cites·14 claims
- 1552US11784022B2Electron beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 10, 2023·0 cites·8 claims
- 1651US11139143B2Spin polarimeterHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 5, 2021·0 cites·13 claims
- 1751US10262830B2Scanning electron microscope and electron trajectory adjustment method thereforHITACHI LTD·Filed 2014·Granted Apr 16, 2019·0 cites·12 claims
- 1851US2024249911A1Spin-polarized scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1950US12437958B2Electron beam application deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 7, 2025·0 cites·15 claims
- 2050US12217928B2Electron gun and electron microscopeHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 4, 2025·0 cites·14 claims
- 2150US11961699B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 16, 2024·0 cites·15 claims
- 2250US2024128049A1Electron microscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2349US12165828B2Electron gun and electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 10, 2024·0 cites·11 claims
- 2448US2024161997A1Electron beam application deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2547US2010177608A1Optical disc and method for controlling the sameMORISHITA HIDEO·Filed 2007·Application pending·0 cites
- 2644US11189457B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 30, 2021·0 cites·15 claims
- 2744US2006262671A1Recording medium recorder/player deviceMORISHITA HIDEO·Filed 2006·Application pending·0 cites
- 2841US2021319970A1Electron beam application deviceHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
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