Inventor · disambiguated record
Yair Faiershtein
Also filed as: FAIERSHTEIN YAIR
2 granted patents·7 citations·filing 2009–2012
53Inventor score
Top patents by PatentIndex Score
2 records- 0182US8471215B1Integrated circuit sample preparation for alpha emission measurementsMARVELL ISRAEL MISL LTD·Filed 2012·Granted Jun 25, 2013·6 cites·17 claims
- 0255US8330117B1Integrated circuit sample preparation for alpha emission measurementsKURIN ELI·Filed 2009·Granted Dec 11, 2012·1 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →