Inventor · disambiguated record
Kazutoshi Kaji
Also filed as: KAJI KAZUTOSHI
19 granted patents·3 pending applications·158 citations·filing 1995–2015
94Inventor score
Files withHITACHI LTD10HITACHI HIGH TECH CORP7HITACHI HIGH TECHNOLOGIES CO1JAPAN RES DEV CORP1KAJI KAZUTOSHI1
Top patents by PatentIndex Score
22 records- 0193US7250601B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 31, 2007·15 cites·8 claims
- 0291US7928376B2Element mapping unit, scanning transmission electron microscope, and element mapping methodHITACHI LTD·Filed 2005·Granted Apr 19, 2011·15 cites·9 claims
- 0389US7476872B2Method and apparatus for observing inside structures, and specimen holderHITACHI LTD·Filed 2007·Granted Jan 13, 2009·9 cites·4 claims
- 0489US6703613B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI LTD·Filed 2001·Granted Mar 9, 2004·28 cites·12 claims
- 0585US6794648B2Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodHITACHI LTD·Filed 2002·Granted Sep 21, 2004·19 cites·19 claims
- 0681US8134131B2Method and apparatus for observing inside structures, and specimen holderTERADA SHOHEI·Filed 2008·Granted Mar 13, 2012·4 cites·3 claims
- 0781US7888641B2Electron microscope with electron spectrometerHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·6 cites·4 claims
- 0881US6930306B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Aug 16, 2005·15 cites·10 claims
- 0979US8344320B2Electron microscope with electron spectrometerHITACHI HIGH TECH CORP·Filed 2011·Granted Jan 1, 2013·4 cites·18 claims
- 1078US8901493B2Electron microscopeKAJI KAZUTOSHI·Filed 2010·Granted Dec 2, 2014·5 cites·6 claims
- 1175US6933501B2Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodHITACHI LTD·Filed 2004·Granted Aug 23, 2005·10 cites·2 claims
- 1264US7053372B2Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the sameHITACHI HIGH TECHNOLOGIES CO·Filed 2005·Granted May 30, 2006·7 cites·26 claims
- 1363US7544935B2Method and apparatus for evaluating thin filmsHITACHI LTD·Filed 2005·Granted Jun 9, 2009·1 cites·18 claims
- 1461US7462830B2Method and apparatus for observing inside structures, and specimen holderHITACHI LTD·Filed 2004·Granted Dec 9, 2008·2 cites·21 claims
- 1561US6933500B2Electron microscopeHITACHI LTD·Filed 2003·Granted Aug 23, 2005·3 cites·10 claims
- 1657US6855927B2Method and apparatus for observing element distributionHITACHI HIGH TECH CORP·Filed 2003·Granted Feb 15, 2005·3 cites·6 claims
- 1754US2005167589A1Electron microscopeHITACHI LTD·Filed 2005·Application pending·0 cites
- 1853US2005127295A1Electron microscopeHITACHI LTD·Filed 2005·Application pending·0 cites
- 1952US7872232B2Electronic microscope apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 18, 2011·0 cites·15 claims
- 2042US5650043AEtching method using NH4 F solution to make surface of silicon smooth in atomic orderJAPAN RES DEV CORP·Filed 1995·Granted Jul 22, 1997·12 cites·3 claims
- 2142US2003085350A1Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodFiled 2001·Application pending·0 cites
- 2237US10373802B2Transmission scanning microscopy including electron energy loss spectroscopy and observation method thereofHITACHI HIGH TECH CORP·Filed 2015·Granted Aug 6, 2019·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →