Inventor · disambiguated record

Eika Tsunemi

Also filed as: TSUNEMI EIKA

1 granted patent·0 citations·filing 2009–2009

6Inventor score

Technology areasB82Y

Files withTSUNEMI EIKA1

Top patents by PatentIndex Score

1 record

0139US8225418B2Method for processing output of scanning type probe microscope, and scanning type probe microscopeTSUNEMI EIKA·Filed 2009·Granted Jul 17, 2012·0 cites·7 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →