Inventor · disambiguated record
Boryau (Jack) Sheu
Also filed as: SHEU BORYAU JACK
11 granted patents·326 citations·filing 2004–2008
92Inventor score
Technology areasG01R
Files withSYNTEST TECHNOLOGIES INC11
Top patents by PatentIndex Score
11 records- 0197US7412637B2Method and apparatus for broadcasting test patterns in a scan based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2006·Granted Aug 12, 2008·62 cites·86 claims
- 0295US7032148B2Mask network design for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Apr 18, 2006·84 cites·76 claims
- 0393US7945833B1Method and apparatus for pipelined scan compressionSYNTEST TECHNOLOGIES INC·Filed 2007·Granted May 17, 2011·29 cites·34 claims
- 0490US7231570B2Method and apparatus for multi-level scan compressionSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Jun 12, 2007·21 cites·30 claims
- 0587US7512851B2Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Mar 31, 2009·39 cites·46 claims
- 0687US7210082B1Method for performing ATPG and fault simulation in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Apr 24, 2007·16 cites·10 claims
- 0785US7721172B2Method and apparatus for broadcasting test patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2008·Granted May 18, 2010·11 cites·26 claims
- 0884US7124342B2Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Oct 17, 2006·31 cites·102 claims
- 0983US7779322B1Compacting test responses using X-driven compactorSYNTEST TECHNOLOGIES INC·Filed 2007·Granted Aug 17, 2010·12 cites·12 claims
- 1083US7590905B2Method and apparatus for pipelined scan compressionSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Sep 15, 2009·13 cites·40 claims
- 1179US7735049B2Mask network design for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2006·Granted Jun 8, 2010·8 cites·38 claims
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