Inventor · disambiguated record
Chi-Chan Hsu
Also filed as: HSU CHI-CHAN
4 granted patents·1 pending application·133 citations·filing 2002–2008
80Inventor score
Files withSYNTEST TECHNOLOGIES INC4
Top patents by PatentIndex Score
5 records- 0194US6954887B2Multiple-capture DFT system for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Oct 11, 2005·64 cites·33 claims
- 0291US7191373B2Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniquesSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Mar 13, 2007·48 cites·19 claims
- 0378US7444567B2Method and apparatus for unifying self-test with scan-test during prototype debug and production testSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Oct 28, 2008·17 cites·18 claims
- 0468US7904773B2Multiple-capture DFT system for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2008·Granted Mar 8, 2011·4 cites·34 claims
- 0530US2002194558A1Method and system to optimize test cost and disable defects for scan and BIST memoriesFiled 2002·Application pending·0 cites
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