Inventor · disambiguated record
Detlef Knebel
Also filed as: KNEBEL DETLEF
12 granted patents·208 citations·filing 2002–2020
89Inventor score
Top patents by PatentIndex Score
12 records- 0194US7022985B2Apparatus and method for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2002·Granted Apr 4, 2006·122 cites·18 claims
- 0288US8506909B2Device for receiving a test sampleSUENWOLDT OLAF·Filed 2005·Granted Aug 13, 2013·29 cites·22 claims
- 0380US8415613B2Method and apparatus for characterizing a sample with two or more optical trapsHEYN SVEN-PETER·Filed 2008·Granted Apr 9, 2013·26 cites·16 claims
- 0477US7442922B2Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technologyJPK INSTRUMENTS AG·Filed 2003·Granted Oct 28, 2008·18 cites·20 claims
- 0570US11156632B2Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscopeBRUKER NANO GMBH·Filed 2020·Granted Oct 26, 2021·1 cites·13 claims
- 0666US7155962B2Method and apparatus to study a surfactantJPK INSTRUMENTS AG·Filed 2002·Granted Jan 2, 2007·8 cites·23 claims
- 0755US7473894B2Apparatus and method for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2006·Granted Jan 6, 2009·4 cites·22 claims
- 0852US7971266B2Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscopeJPK INSTRUMENTS AG·Filed 2009·Granted Jun 28, 2011·0 cites·28 claims
- 0946US7934323B2Method and a device for the positioning of a displaceable component in an examining systemJPK INSTRUMENTS AG·Filed 2006·Granted May 3, 2011·0 cites·21 claims
- 1040US10539591B2Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscopeBRUKER NANO GMBH·Filed 2018·Granted Jan 21, 2020·0 cites·13 claims
- 1134US8898809B2Method and apparatus for the combined analysis of a sample with objects to be analyzedMÜLLER TORSTEN·Filed 2008·Granted Nov 25, 2014·0 cites·8 claims
- 1233US8505109B2Measuring probe device for a probe microscope, measuring cell and scanning probe microscopeJAEHNKE TORSTEN·Filed 2008·Granted Aug 6, 2013·0 cites·13 claims
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