Inventor · disambiguated record
James S. Nakos
Also filed as: NAKOS JAMES S · NAKOS JAMES SPIROS
63 granted patents·7 pending applications·1,089 citations·filing 1991–2015
99Inventor score
Top patents by PatentIndex Score
70 records- 0195US6054745ANonvolatile memory cell using microelectromechanical deviceIBM·Filed 1999·Granted Apr 25, 2000·114 cites·31 claims
- 0292US7067368B1Method for forming self-aligned dual salicide in CMOS technologiesIBM·Filed 2005·Granted Jun 27, 2006·17 cites·10 claims
- 0391US5268330AProcess for improving sheet resistance of an integrated circuit device gateIBM·Filed 1992·Granted Dec 7, 1993·131 cites·37 claims
- 0490US6498096B2Borderless contact to diffusion with respect to gate conductor and methods for fabricatingIBM·Filed 2001·Granted Dec 24, 2002·62 cites·11 claims
- 0589US5431777AMethods and compositions for the selective etching of siliconIBM·Filed 1992·Granted Jul 11, 1995·110 cites·7 claims
- 0687US5828131ALow temperature formation of low resistivity titanium silicideIBM·Filed 1996·Granted Oct 27, 1998·60 cites·6 claims
- 0787US5226732AEmissivity independent temperature measurement systemsIBM·Filed 1992·Granted Jul 13, 1993·85 cites·20 claims
- 0886US8143135B2Embedded series deep trench capacitors and methods of manufactureKEMERER TIMOTHY W·Filed 2009·Granted Mar 27, 2012·12 cites·16 claims
- 0986US7138691B2Selective nitridation of gate oxidesIBM·Filed 2004·Granted Nov 21, 2006·31 cites·8 claims
- 1086US6780720B2Method for fabricating a nitrided silicon-oxide gate dielectricIBM·Filed 2002·Granted Aug 24, 2004·37 cites·22 claims
- 1185US6650000B2Apparatus and method for forming a battery in an integrated circuitIBM·Filed 2001·Granted Nov 18, 2003·37 cites·14 claims
- 1284US8284017B2Structure having substantially parallel resistor material lengthsHAKEY MARK C·Filed 2011·Granted Oct 9, 2012·7 cites·14 claims
- 1383US7897939B2Removable liners for charged particle beam systemsIBM·Filed 2008·Granted Mar 1, 2011·7 cites·24 claims
- 1483US7045372B2Apparatus and method for forming a battery in an integrated circuitIBM·Filed 2003·Granted May 16, 2006·31 cites·33 claims
- 1583US6373095B1NVRAM cell having increased coupling ratio between a control gate and floating gate without an increase in cell areaIBM·Filed 1998·Granted Apr 16, 2002·56 cites·8 claims
- 1680US8338265B2Silicided trench contact to buried conductive layerCOOLBAUGH DOUGLAS D·Filed 2008·Granted Dec 25, 2012·7 cites·16 claims
- 1779US7462845B2Removable liners for charged particle beam systemsIBM·Filed 2006·Granted Dec 9, 2008·5 cites·1 claims
- 1877US7759260B2Selective nitridation of gate oxidesIBM·Filed 2006·Granted Jul 20, 2010·5 cites·21 claims
- 1977US7112481B2Method for forming self-aligned dual salicide in CMOS technologiesIBM·Filed 2005·Granted Sep 26, 2006·5 cites·20 claims
- 2075US8796044B2Ferroelectric random access memory with optimized hardmaskIBM·Filed 2012·Granted Aug 5, 2014·3 cites·10 claims
- 2174US6967167B2Silicon dioxide removing methodIBM·Filed 2003·Granted Nov 22, 2005·16 cites·12 claims
- 2273US8012848B2Trench isolation and method of fabricating trench isolationIBM·Filed 2007·Granted Sep 6, 2011·4 cites·6 claims
- 2371US8872281B2Silicided trench contact to buried conductive layerCOOLBAUGH DOUGLAS D·Filed 2012·Granted Oct 28, 2014·3 cites·20 claims
- 2471US7291568B2Method for fabricating a nitrided silicon-oxide gate dielectricIBM·Filed 2003·Granted Nov 6, 2007·13 cites·19 claims
- 2570US8111129B2Resistor and design structure having substantially parallel resistor material lengthsHAKEY MARK C·Filed 2008·Granted Feb 7, 2012·3 cites·8 claims
- 2670US6022770ANVRAM utilizing high voltage TFT device and method for making the sameIBM·Filed 1998·Granted Feb 8, 2000·25 cites·18 claims
- 2769US9385179B2Deep trench decoupling capacitor and methods of formingGLOBALFOUNDRIES INC·Filed 2013·Granted Jul 5, 2016·2 cites·4 claims
- 2869US8492816B2Deep trench decoupling capacitorNAKOS JAMES S·Filed 2010·Granted Jul 23, 2013·3 cites·4 claims
- 2968US8658435B2Hydrogen barrier liner for ferro-electric random access memory (FRAM) chipIBM·Filed 2013·Granted Feb 25, 2014·2 cites·14 claims
- 3068US8395196B2Hydrogen barrier liner for ferro-electric random access memory (FRAM) chipCZABAJ BRIAN M·Filed 2010·Granted Mar 12, 2013·3 cites·15 claims
- 3168US6522304B2Dual damascene horn antennaIBM·Filed 2001·Granted Feb 18, 2003·19 cites·13 claims
- 3268US5185294ABoron out-diffused surface strap processIBM·Filed 1991·Granted Feb 9, 1993·42 cites·22 claims
- 3367US8441103B2Embedded series deep trench capacitors and methods of manufactureKEMERER TIMOTHY W·Filed 2012·Granted May 14, 2013·2 cites·11 claims
- 3466US8614137B2Dual contact trench resistor in shallow trench isolation (STI) and methods of manufactureKEMERER TIMOTHY W·Filed 2011·Granted Dec 24, 2013·2 cites·25 claims
- 3566US7759189B2Method of manufacturing a dual contact trench capacitorIBM·Filed 2008·Granted Jul 20, 2010·3 cites·20 claims
- 3664US9105677B2Base profile of self-aligned bipolar transistors for power amplifier applicationsIBM·Filed 2013·Granted Aug 11, 2015·1 cites·20 claims
- 3762US8741729B2Dual contact trench resistor and capacitor in shallow trench isolation (STI) and methods of manufactureIBM·Filed 2013·Granted Jun 3, 2014·1 cites·14 claims
- 3862US7897473B2Method of manufacturing a dual contact trench capacitorIBM·Filed 2008·Granted Mar 1, 2011·2 cites·24 claims
- 3962US7888142B2Copper contamination detection method and system for monitoring copper contaminationIBM·Filed 2007·Granted Feb 15, 2011·1 cites·15 claims
- 4062US6706644B2Thermal nitrogen distribution method to improve uniformity of highly doped ultra-thin gate capacitorsIBM·Filed 2002·Granted Mar 16, 2004·7 cites·3 claims
- 4160US8546243B2Dual contact trench resistor and capacitor in shallow trench isolation (STI) and methods of manufactureKEMERER TIMOTHY W·Filed 2011·Granted Oct 1, 2013·1 cites·16 claims
- 4260US6221704B1Process for fabricating short channel field effect transistor with a highly conductive gateIBM·Filed 1998·Granted Apr 24, 2001·19 cites·33 claims
- 4359US6339015B1Method of fabricating a non-volatile semiconductor deviceIBM·Filed 2000·Granted Jan 15, 2002·7 cites·15 claims
- 4458US7897940B2Removable liners for charged particle beam systemsIBM·Filed 2008·Granted Mar 1, 2011·0 cites·27 claims
- 4558US6256755B1Apparatus and method for detecting defective NVRAM cellsIBM·Filed 1998·Granted Jul 3, 2001·16 cites·12 claims
- 4657US8384140B2Structure for dual contact trench capacitor and structure thereofIBM·Filed 2008·Granted Feb 26, 2013·1 cites·23 claims
- 4755US6215190B1Borderless contact to diffusion with respect to gate conductor and methods for fabricatingIBM·Filed 1998·Granted Apr 10, 2001·18 cites·7 claims
- 4855US5565060AMethods and compositions for the selective etching of siliconIBM·Filed 1995·Granted Oct 15, 1996·17 cites·13 claims
- 4954US7064025B1Method for forming self-aligned dual salicide in CMOS technologiesIBM·Filed 2004·Granted Jun 20, 2006·4 cites·21 claims
- 5054US2011088008A1Method for conversion of commercial microprocessor to radiation-hardened processor and resulting processorIBM·Filed 2009·Application pending·0 cites
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