Inventor · disambiguated record
Fang-Cheng Chang
Also filed as: CHANG FANG-CHENG
25 granted patents·4 pending applications·2,171 citations·filing 1998–2022
97Inventor score
Files withSYNOPSYS INC12NUMERICAL TECH INC11CLEAR SHAPE TECHNOLOGIES INC2ASML NETHERLANDS BV1CADENCE DESIGN SYSTEMS INC1
Top patents by PatentIndex Score
29 records- 0199US6370679B1Data hierarchy layout correction and verification method and apparatusNUMERICAL TECH INC·Filed 1998·Granted Apr 9, 2002·498 cites·100 claims
- 0298US6470489B1Design rule checking system and methodNUMERICAL TECH INC·Filed 1998·Granted Oct 22, 2002·516 cites·11 claims
- 0397US6757645B2Visual inspection and verification systemNUMERICAL TECH INC·Filed 1998·Granted Jun 29, 2004·207 cites·64 claims
- 0495US7653890B2Modeling resolution enhancement processes in integrated circuit fabricationCADENCE DESIGN SYSTEMS INC·Filed 2005·Granted Jan 26, 2010·25 cites·20 claims
- 0595US7617474B2System and method for providing defect printability analysis of photolithographic masks with job-based automationSYNOPSYS INC·Filed 2006·Granted Nov 10, 2009·22 cites·11 claims
- 0694US7093229B2System and method for providing defect printability analysis of photolithographic masks with job-based automationSYNOPSYS INC·Filed 2003·Granted Aug 15, 2006·54 cites·42 claims
- 0794US6584609B1Method and apparatus for mixed-mode optical proximity correctionNUMERICAL TECH INC·Filed 2000·Granted Jun 24, 2003·99 cites·16 claims
- 0893US7107571B2Visual analysis and verification system using advanced toolsSYNOPSYS INC·Filed 2001·Granted Sep 12, 2006·87 cites·60 claims
- 0993US6453452B1Method and apparatus for data hierarchy maintenance in a system for mask descriptionNUMERICAL TECH INC·Filed 1998·Granted Sep 17, 2002·186 cites·92 claims
- 1092US6560766B2Method and apparatus for analyzing a layout using an instance-based representationNUMERICAL TECH INC·Filed 2001·Granted May 6, 2003·82 cites·39 claims
- 1191US6523162B1General purpose shape-based layout processing scheme for IC layout modificationsNUMERICAL TECH INC·Filed 2000·Granted Feb 18, 2003·108 cites·54 claims
- 1288US6880135B2Method of incorporating lens aberration information into various process flowsSYNOPSYS INC·Filed 2001·Granted Apr 12, 2005·34 cites·44 claims
- 1387US7360191B2Delta information design closure integrated circuit fabricationCLEAR SHAPE TECHNOLOGIES INC·Filed 2004·Granted Apr 15, 2008·57 cites·37 claims
- 1486US6795168B2Method and apparatus for exposing a wafer using multiple masks during an integrated circuit manufacturing processNUMERICAL TECH INC·Filed 2002·Granted Sep 21, 2004·27 cites·10 claims
- 1585US7014955B2System and method for indentifying dummy features on a mask layerSYNOPSYS INC·Filed 2001·Granted Mar 21, 2006·24 cites·19 claims
- 1679US7523027B2Visual inspection and verification systemSYNOPSYS INC·Filed 2004·Granted Apr 21, 2009·14 cites·76 claims
- 1778US7457736B2Automated creation of metrology recipesSYNOPSYS INC·Filed 2002·Granted Nov 25, 2008·15 cites·66 claims
- 1878US6976240B2Simulation using design geometry informationSYNOPSYS INC·Filed 2001·Granted Dec 13, 2005·15 cites·27 claims
- 1976US6996790B2System and method for generating a two-dimensional yield map for a full layoutSYNOPSYS INC·Filed 2003·Granted Feb 7, 2006·22 cites·47 claims
- 2074US6988259B2Method and apparatus for mixed-mode optical proximity correctionSYNOPSYS INC·Filed 2002·Granted Jan 17, 2006·17 cites·20 claims
- 2172US7216320B2Delta-geometry timing prediction in integrated circuit fabricationCLEAR SHAPE TECHNOLOGIES INC·Filed 2004·Granted May 8, 2007·18 cites·47 claims
- 2272US6721928B2Verification utilizing instance-based hierarchy managementNUMERICAL TECH INC·Filed 2002·Granted Apr 13, 2004·17 cites·21 claims
- 2369US7356788B2Method and apparatus for data hierarchy maintenance in a system for mask descriptionSYNOPSYS INC·Filed 2002·Granted Apr 8, 2008·12 cites·14 claims
- 2465US7483559B2Method and apparatus for deblurring mask imagesSYNOPSYS INC·Filed 2004·Granted Jan 27, 2009·13 cites·25 claims
- 2547US2024331115A1Image distortion correction in charged particle inspectionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 2642US2006242618A1Lithographic simulations using graphical processing unitsWANG YAO-TING·Filed 2006·Application pending·0 cites
- 2740US2003061592A1General purpose shape-based layout processing scheme for IC layout modificationsNUMERICAL TECH INC·Filed 2002·Application pending·0 cites
- 2837US7052826B2Monitoring method, process and system for photoresist regenerationIND TECH RES INST·Filed 2004·Granted May 30, 2006·2 cites·16 claims
- 2935US2004197672A1Programmable aperture for lithographic imaging systemsNUMERICAL TECH INC·Filed 2003·Application pending·0 cites
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