P

Inventor

IYER RAVI

US140 patents
⚠️ This page may combine multiple inventors who share the name “IYER RAVI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

47 patents
US6039851AMar 21, 2000

Reactive sputter faceting of silicon dioxide to enhance gap fill of spaces between metal lines

MICRON TECHNOLOGY INC306 citations99
US5872052AFeb 16, 1999

Planarization using plasma oxidized amorphous silicon

MICRON TECHNOLOGY INC336 citations99
US5847463ADec 8, 1998

Local interconnect comprising titanium nitride barrier layer

MICRON TECHNOLOGY INC115 citations99
US5735960AApr 7, 1998

Apparatus and method to increase gas residence time in a reactor

MICRON TECHNOLOGY INC119 citations99
US5733816AMar 31, 1998

Method for depositing a tungsten layer on silicon

MICRON TECHNOLOGY INC356 citations98
US5643048AJul 1, 1997

Endpoint regulator and method for regulating a change in wafer thickness in chemical-mechanical planarization of semiconductor wafers

MICRON TECHNOLOGY INC129 citations98
US7214621B2May 8, 2007

Methods of forming devices associated with semiconductor constructions

MICRON TECHNOLOGY INC79 citations97
US7268078B2Sep 11, 2007

Chemical vapor deposition of titanium from titanium tetrachloride and hydrocarbon reactants

MICRON TECHNOLOGY INC50 citations96
US6809025B2Oct 26, 2004

Method of making a void-free aluminum film

MICRON TECHNOLOGY INC63 citations96
US6555471B2Apr 29, 2003

Method of making a void-free aluminum film

MICRON TECHNOLOGY INC34 citations96
US6383723B1May 7, 2002

Method to clean substrate and improve photoresist profile

MICRON TECHNOLOGY INC75 citations96
US6333556B1Dec 25, 2001

Insulating materials

MICRON TECHNOLOGY INC65 citations96
US6313046B1Nov 6, 2001

Method of forming materials between conductive electrical components, and insulating materials

MICRON TECHNOLOGY INC50 citations96
US6281100B1Aug 28, 2001

Semiconductor processing methods

MICRON TECHNOLOGY INC62 citations96
US6174590B1Jan 16, 2001

Isolation using an antireflective coating

MICRON TECHNOLOGY INC37 citations96
US6156630ADec 5, 2000

Titanium boride gate electrode and interconnect and methods regarding same

MICRON TECHNOLOGY INC45 citations96
US6144098ANov 7, 2000

Techniques for improving adhesion of silicon dioxide to titanium

MICRON TECHNOLOGY INC75 citations96
US6121133ASep 19, 2000

Isolation using an antireflective coating

MICRON TECHNOLOGY INC57 citations96
US5981380ANov 9, 1999

Method of forming a local interconnect including selectively etched conductive layers and recess formation

MICRON TECHNOLOGY INC60 citations96
US5946594AAug 31, 1999

Chemical vapor deposition of titanium from titanium tetrachloride and hydrocarbon reactants

MICRON TECHNOLOGY INC42 citations96
US5917213AJun 29, 1999

Depletion compensated polysilicon electrodes

MICRON TECHNOLOGY INC34 citations96
US5910684AJun 8, 1999

Integrated circuitry

MICRON TECHNOLOGY INC64 citations96
US5844318ADec 1, 1998

Aluminum film for semiconductive devices

MICRON TECHNOLOGY INC39 citations96
US5736455AApr 7, 1998

Method for passivating the sidewalls of a tungsten word line

MICRON TECHNOLOGY INC69 citations96
US6455394B1Sep 24, 2002

Method for trench isolation by selective deposition of low temperature oxide films

MICRON TECHNOLOGY INC55 citations95
US5856236AJan 5, 1999

Method of depositing a smooth conformal aluminum film on a refractory metal nitride layer

MICRON TECHNOLOGY INC38 citations94
US7659560B2Feb 9, 2010

Transistor structures

MICRON TECHNOLOGY INC15 citations93
US7112542B2Sep 26, 2006

Methods of forming materials between conductive electrical components, and insulating materials

MICRON TECHNOLOGY INC18 citations93
US6977225B2Dec 20, 2005

Chemical vapor deposition of titanium from titanium tetrachloride and hydrocarbon reactants

MICRON TECHNOLOGY INC12 citations93
US6544876B1Apr 8, 2003

Titanium boride gate electrode and interconnect and methods regarding same

MICRON TECHNOLOGY INC19 citations93
US6541830B1Apr 1, 2003

Titanium boride gate electrode and interconnect

MICRON TECHNOLOGY INC17 citations93
US6495450B1Dec 17, 2002

Isolation using an antireflective coating

MICRON TECHNOLOGY INC17 citations93
US6423631B1Jul 23, 2002

Isolation using an antireflective coating

MICRON TECHNOLOGY INC14 citations93
US6372669B2Apr 16, 2002

Method of depositing silicon oxides

MICRON TECHNOLOGY INC19 citations93
US6297175B1Oct 2, 2001

Method for improving thickness uniformity of deposited ozone-TEOS silicate glass layers

MICRON TECHNOLOGY INC24 citations93
US6281101B1Aug 28, 2001

Process of forming metal silicide interconnects

MICRON TECHNOLOGY INC18 citations93
US6184136B1Feb 6, 2001

Chemical vapor deposition of titanium from titanium tetrachloride and hydrocarbon reactants

MICRON TECHNOLOGY INC18 citations93
US6162499ADec 19, 2000

Method of inhibiting deposition of material on an internal wall of a chemical vapor deposition reactor

MICRON TECHNOLOGY INC23 citations93
US6107214AAug 22, 2000

Method for improving thickness uniformity of deposited ozone-TEOS silicate glass layers

MICRON TECHNOLOGY INC19 citations93
US6046098AApr 4, 2000

Process of forming metal silicide interconnects

MICRON TECHNOLOGY INC19 citations93
US5997639ADec 7, 1999

Method of reducing carbon incorporation into films produced by chemical vapor deposition involving organometallic precursor compounds

MICRON TECHNOLOGY INC26 citations93
US5985770ANov 16, 1999

Method of depositing silicon oxides

MICRON TECHNOLOGY INC39 citations93
US5963835AOct 5, 1999

Method of forming aluminum film

MICRON TECHNOLOGY INC19 citations93
US5946542AAug 31, 1999

Method of depositing passivation layers on semiconductor device arrays

MICRON TECHNOLOGY INC40 citations93
US5935336AAug 10, 1999

Apparatus to increase gas residence time in a reactor

MICRON TECHNOLOGY INC30 citations93
US5824365AOct 20, 1998

Method of inhibiting deposition of material on an internal wall of a chemical vapor deposition reactor

MICRON TECHNOLOGY INC33 citations93
US5629246AMay 13, 1997

Method for forming fluorine-doped glass having low concentrations of free fluorine

MICRON TECHNOLOGY INC34 citations93

SPLUNK INC

1 patent

MICRON SEMICONDUCTOR INC

1 patent

INTEL CORP

1 patent

Showing the top 50 of 140 patents by PatentIndex Score.