Inventor · disambiguated record
Yoshimasa Ooshima
Also filed as: OOSHIMA YOSHIMASA
10 granted patents·2 pending applications·210 citations·filing 1991–2011
91Inventor score
Top patents by PatentIndex Score
12 records- 0195US6797975B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2001·Granted Sep 28, 2004·56 cites·6 claims
- 0293US7315366B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2007·Granted Jan 1, 2008·17 cites·5 claims
- 0391US7231079B2Method and system for inspecting electronic circuit patternHITACHI LTD·Filed 2002·Granted Jun 12, 2007·44 cites·27 claims
- 0487US7187438B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2002·Granted Mar 6, 2007·25 cites·24 claims
- 0586US7115892B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 3, 2006·7 cites·5 claims
- 0685US7511806B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2007·Granted Mar 31, 2009·7 cites·18 claims
- 0783US7256412B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Aug 14, 2007·5 cites·6 claims
- 0864US5321354AMethod for inspecting semiconductor devicesSEIKO EPSON CORP·Filed 1991·Granted Jun 14, 1994·47 cites·23 claims
- 0962US6998630B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 14, 2006·2 cites·16 claims
- 1058US2007257214A1Method and apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2007·Application pending·0 cites
- 1157US8072597B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceNISHIYAMA HIDETOSHI·Filed 2008·Granted Dec 6, 2011·0 cites·14 claims
- 1253US2012062890A1Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor DeviceNISHIYAMA HIDETOSHI·Filed 2011·Application pending·0 cites
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