Inventor · disambiguated record
Talat Hasan
Also filed as: HASAN TALAT · HASAN TALAT F · HASAN TALAT FATIMA
10 granted patents·396 citations·filing 1997–2006
92Inventor score
Top patents by PatentIndex Score
10 records- 0195US6690473B1Integrated surface metrologySENSYS INSTR CORP·Filed 2000·Granted Feb 10, 2004·110 cites·9 claims
- 0293US6182510B1Apparatus and method for characterizing semiconductor wafers during processingSENSYS INSTR CORP·Filed 2000·Granted Feb 6, 2001·57 cites·20 claims
- 0391US7283226B2Measurement system clusterTOKYO ELECTRON LTD·Filed 2006·Granted Oct 16, 2007·16 cites·7 claims
- 0489US7254458B2Systems and methods for metrology recipe and model generationTOKYO ELECTRON LTD·Filed 2006·Granted Aug 7, 2007·21 cites·14 claims
- 0589US5996415AApparatus and method for characterizing semiconductor wafers during processingSENSYS INSTR CORP·Filed 1997·Granted Dec 7, 1999·79 cites·22 claims
- 0688US6829054B2Integrated surface metrologySENSYS INSTR CORP·Filed 2003·Granted Dec 7, 2004·37 cites·6 claims
- 0779US7089075B2Systems and methods for metrology recipe and model generationTOKYO ELECTRON LTD·Filed 2002·Granted Aug 8, 2006·23 cites·26 claims
- 0874US6112595AApparatus and method for characterizing semiconductor wafers during processingSENSYS INSTR CORP·Filed 1999·Granted Sep 5, 2000·32 cites·11 claims
- 0971US7106433B2Measurement system clusterTOKYO ELECTRON LTD·Filed 2004·Granted Sep 12, 2006·11 cites·21 claims
- 1070US6999164B2Measurement system clusterTOKYO ELECTRON LTD·Filed 2002·Granted Feb 14, 2006·10 cites·18 claims
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