Inventor · disambiguated record
Yun Jing Lin
Also filed as: LIN YUN JING
10 granted patents·33 citations·filing 2010–2020
84Inventor score
Files withREALTEK SEMICONDUCTOR CORP3TAIWAN SEMICONDUCTOR MFG3TAIWAN SEMICONDUCTOR MFG CO LTD2LIN YUN JING1PAN TE-JEN1
Top patents by PatentIndex Score
10 records- 0192US8455952B2Spacer elements for semiconductor deviceLIN YUN JING·Filed 2010·Granted Jun 4, 2013·22 cites·18 claims
- 0288US9111906B2Method for fabricating semiconductor device having spacer elementsTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Aug 18, 2015·7 cites·20 claims
- 0373US9153655B2Spacer elements for semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Oct 6, 2015·2 cites·17 claims
- 0465US8735988B2Semiconductor device having a first spacer element and an adjacent second spacer elementTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted May 27, 2014·1 cites·19 claims
- 0560US10657303B2Circuit encoding method and circuit structure recognition methodREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted May 19, 2020·1 cites·11 claims
- 0657US11955547B2Semiconductor device including an epitaxy regionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Apr 9, 2024·0 cites·20 claims
- 0754US10164093B2Semiconductor device including an epitaxy regionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 25, 2018·0 cites·20 claims
- 0848US10783293B2Circuit design system, checking method, and non-transitory computer readable medium thereofREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Sep 22, 2020·0 cites·20 claims
- 0946US11959956B2Circuit check method and electronic apparatusREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted Apr 16, 2024·0 cites·8 claims
- 1041US9595477B2Semiconductor device including an epitaxy regionPAN TE-JEN·Filed 2011·Granted Mar 14, 2017·0 cites·13 claims
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