Inventor · disambiguated record
Marcel Pelgrom
Also filed as: PELGROM MARCEL · PELGROM MARCEL J M
11 granted patents·3 pending applications·30 citations·filing 1992–2009
86Inventor score
Top patents by PatentIndex Score
14 records- 0164US7538570B2Supply voltage monitoringNXP BV·Filed 2006·Granted May 26, 2009·7 cites·16 claims
- 0257US8022752B2Voltage reference circuit for low supply voltagesNXP BV·Filed 2009·Granted Sep 20, 2011·4 cites·17 claims
- 0356US7605740B2Flash analog-to-digital converterNXP BV·Filed 2006·Granted Oct 20, 2009·3 cites·7 claims
- 0454US8203368B2DLL for period jitter measurementPELGROM MARCEL J M·Filed 2009·Granted Jun 19, 2012·3 cites·8 claims
- 0552US7710136B2Intergrated circuit self-test architectureNXP BV·Filed 2005·Granted May 4, 2010·2 cites·6 claims
- 0641US8874394B2Simple and stable reference for IR-drop and supply noise measurementsVEENDRICK HENDRICUS JOSEPH MARIA·Filed 2009·Granted Oct 28, 2014·0 cites·14 claims
- 0741US7791357B2On silicon interconnect capacitance extractionNXP BV·Filed 2005·Granted Sep 7, 2010·1 cites·14 claims
- 0841US2011140730A1Detection circuitry for detecting bonding conditions on bond padsNXP BV·Filed 2009·Application pending·0 cites
- 0937US8690065B2Secure storage of a codeword within an integrated circuitPELGROM MARCEL·Filed 2008·Granted Apr 8, 2014·1 cites·10 claims
- 1037US5216495AComb filter arrangement having delay time compensation and load matching in all circuit pathsPHILIPS CORP·Filed 1992·Granted Jun 1, 1993·5 cites·12 claims
- 1135US2010315114A1Semiconductor device with test structure and semiconductor device test methodNXP BV·Filed 2009·Application pending·0 cites
- 1233US7928882B2Monitoring physical operating parameters of an integrated circuitNXP BV·Filed 2005·Granted Apr 19, 2011·0 cites·16 claims
- 1332US2008094268A1Ad Converter ArrangementKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Application pending·0 cites
- 1431US5528241ADigital-to-analog converterPHILIPS CORP·Filed 1994·Granted Jun 18, 1996·4 cites·16 claims
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