Inventor · disambiguated record
Yoshihiro Toyoda
Also filed as: TOYODA YOSHIHIRO
10 granted patents·3 pending applications·52 citations·filing 1974–2023
85Inventor score
Files withNITTO DENKO CORP6TOYODA YOSHIHIRO2HONJO CHEMICAL KABUSHIKI KAISH1IHARA TERUKAZU1MURAKAMI KOUSUKE1
Top patents by PatentIndex Score
13 records- 0181US6495603B1Anti-inflammatory eye dropWAKAMOTO PHARMA CO LTD·Filed 2000·Granted Dec 17, 2002·28 cites·7 claims
- 0268US10212869B2Method of manufacturing printed circuit board and method of inspecting printed circuit boardNITTO DENKO CORP·Filed 2016·Granted Feb 19, 2019·2 cites·11 claims
- 0367US8310668B2Producing method of wired circuit boardIHARA TERUKAZU·Filed 2010·Granted Nov 13, 2012·2 cites·3 claims
- 0462US8467062B2Inspection device and producing method of wired circuit boardTOYODA YOSHIHIRO·Filed 2011·Granted Jun 18, 2013·1 cites·6 claims
- 0559US8773159B2Method of inspecting printed circuit board, method of manufacturing printed circuit board and inspection device of printed circuit boardMURAKAMI KOUSUKE·Filed 2010·Granted Jul 8, 2014·2 cites·6 claims
- 0656US8378226B2Wired circuit boardNITTO DENKO CORP·Filed 2008·Granted Feb 19, 2013·1 cites·1 claims
- 0756US4621985AHigh vacuum apparatusHONJO CHEMICAL KABUSHIKI KAISH·Filed 1984·Granted Nov 11, 1986·15 cites·5 claims
- 0854US2025107755A1RobotNITTO DENKO CORP·Filed 2023·Application pending·0 cites
- 0948US2009113701A1Producing method of wired circuit boardNITTO DENKO CORP·Filed 2008·Application pending·0 cites
- 1048US2009113704A1Producing method of wired circuit boardNITTO DENKO CORP·Filed 2008·Application pending·0 cites
- 1138US10067073B2Method of manufacturing printed circuit board and method of inspecting printed circuit boardNITTO DENKO CORP·Filed 2016·Granted Sep 4, 2018·0 cites·6 claims
- 1238US8316532B2Method of producing a wired circuit boardTOYODA YOSHIHIRO·Filed 2010·Granted Nov 27, 2012·0 cites·4 claims
- 1324US3989144AApparatus for transferring a moldNIPPON CONCRETE IND CO LTD·Filed 1974·Granted Nov 2, 1976·1 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →