Inventor · disambiguated record
Lee M. White
Also filed as: WHITE LEE M
12 granted patents·1 pending application·133 citations·filing 1992–2011
91Inventor score
Files withWHITMIRE MICRO GEN RES LAB INC8CINK JAMES H2BWI KARTRIDGPAK CO1WHITMIRE HOLDINGS INC1WHITMIRE MICRO GEN RES LABORTA1
Top patents by PatentIndex Score
13 records- 0189US7086196B2Pest control device and methodWHITMIRE MICRO GEN RES LAB INC·Filed 2003·Granted Aug 8, 2006·43 cites·23 claims
- 0284US7874099B2Pest control device and methodWHITMIRE HOLDINGS INC·Filed 2008·Granted Jan 25, 2011·14 cites·11 claims
- 0376US6840461B1Adapter clamp for aerosol canWHITMIRE MICRO GEN RES LAB INC·Filed 2003·Granted Jan 11, 2005·23 cites·19 claims
- 0469US8061238B2Tool and method for removing and installing a tamper-resistant cap of a pest control deviceCINK JAMES H·Filed 2007·Granted Nov 22, 2011·6 cites·26 claims
- 0566USD566225SContainerWHITMIRE MICRO GEN RES LAB INC·Filed 2006·Granted Apr 8, 2008·16 cites·1 claims
- 0663US8225697B2Tool and method for removing and installing a tamper-resistant cap of a pest control deviceCINK JAMES H·Filed 2011·Granted Jul 24, 2012·2 cites·20 claims
- 0752USD471950STermite detection stationWHITMIRE MICRO GEN RES LAB INC·Filed 2002·Granted Mar 18, 2003·8 cites·1 claims
- 0848US7272993B2Tool and method for removing and installing a tamper-resistant cap of a pest control deviceWHITMIRE MICRO GEN RES LAB INC·Filed 2002·Granted Sep 25, 2007·2 cites·12 claims
- 0947US2004200134A1Pest control device and methodWHITMIRE MICRO GEN RES LAB INC·Filed 2004·Application pending·0 cites
- 1044US5307685APressure tester and method of testing therewithBWI KARTRIDGPAK CO·Filed 1992·Granted May 3, 1994·13 cites·22 claims
- 1139USD580510SCapWHITMIRE MICRO GEN RES LABORTA·Filed 2006·Granted Nov 11, 2008·4 cites·1 claims
- 1236USD566223SStationWHITMIRE MICRO GEN RES LAB INC·Filed 2006·Granted Apr 8, 2008·2 cites·1 claims
- 1329USD518372SAdapter clamp for aerosol canWHITMIRE MICRO GEN RES LAB INC·Filed 2003·Granted Apr 4, 2006·0 cites·1 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →