Inventor · disambiguated record
Harunobu Nakagawa
Also filed as: NAKAGAWA HARUNOBU
4 granted patents·89 citations·filing 2001–2014
73Inventor score
Technology areasG11C
Top patents by PatentIndex Score
4 records- 0196US7184338B2Semiconductor device, semiconductor device testing method, and programming methodSPANSION LLC·Filed 2005·Granted Feb 27, 2007·78 cites·33 claims
- 0253US6735126B1Semiconductor memoryFUJITSU LTD·Filed 2002·Granted May 11, 2004·10 cites·9 claims
- 0349US9378089B2Semiconductor storing device and redundancy method thereofWINBOND ELECTRONICS CORP·Filed 2014·Granted Jun 28, 2016·1 cites·9 claims
- 0429US6760271B2Semiconductor memory device with shorter signal linesFUJITSU LTD·Filed 2001·Granted Jul 6, 2004·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →