Inventor · disambiguated record
Goro Hayakawa
Also filed as: HAYAKAWA GORO
8 granted patents·3 pending applications·53 citations·filing 1995–2005
84Inventor score
Top patents by PatentIndex Score
11 records- 0179US7584511B2Data processing apparatus, data processing method, program, program recording medium, data recording medium, and data structureSONY CORP·Filed 2005·Granted Sep 1, 2009·4 cites·11 claims
- 0265US8218560B2Apparatus and method for demultiplicationFUJINAMI YASUSHI·Filed 2005·Granted Jul 10, 2012·2 cites·11 claims
- 0363US6538936B2Semiconductor integrated circuit having test circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Mar 25, 2003·13 cites·10 claims
- 0450US6034904ASemiconductor memory device having selection circuit for arbitrarily setting a word line to selected state at high speed in test modeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 7, 2000·16 cites·1 claims
- 0539US5619457ADynamic semiconductor memory device that can control through current of input buffer circuit for external input/output control signalMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Apr 8, 1997·7 cites·5 claims
- 0638US6366517B1Semiconductor integrated circuit capable of readily adjusting circuit characteristicMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 2, 2002·7 cites·10 claims
- 0734US5563840AIntegrated semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Oct 8, 1996·4 cites·3 claims
- 0831US6285617B1Semiconductor memory device preventing malfunction during refresh operation even when noise is superimposed on control signalMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 4, 2001·0 cites·6 claims
- 0929US2004047225A1Semiconductor device having shared sense amplifier configurationMITSUBISHI ELECTRIC CORP·Filed 2003·Application pending·0 cites
- 1029US2004037149A1Semiconductor memory device capable of normal transition to test modeMITSUBISHI ELECTRIC CORP·Filed 2003·Application pending·0 cites
- 1126US2002009010A1Dynamic random access memoryFiled 1999·Application pending·0 cites
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