Inventor · disambiguated record
Shoichi Inaba
Also filed as: INABA SHOICHI
11 granted patents·1 pending application·204 citations·filing 1995–2020
91Inventor score
Top patents by PatentIndex Score
12 records- 0177US6168684B1Wafer polishing apparatus and polishing methodNEC CORP·Filed 1998·Granted Jan 2, 2001·46 cites·11 claims
- 0275US7685794B2Apparatus for sterilization and filling of cup type containerTOYO SEIKAN KAISHA LTD·Filed 2005·Granted Mar 30, 2010·10 cites·8 claims
- 0375US6093080APolishing apparatus and methodNEC CORP·Filed 1999·Granted Jul 25, 2000·44 cites·13 claims
- 0475US5989658AJoint assembly and a process for manufacturing the same and a movable body and process for manufacturing the sameBANDAI CO·Filed 1997·Granted Nov 23, 1999·39 cites·10 claims
- 0558US5670184AMolding apparatus having a molding cavity divided by an elastic memberBANDAI CO·Filed 1996·Granted Sep 23, 1997·21 cites·6 claims
- 0657US8349420B2Packing body sealed by laser welding and method of sealing the sameTOYO SEIKAN KAISHA LTD·Filed 2009·Granted Jan 8, 2013·2 cites·4 claims
- 0755US6231425B1Polishing apparatus and methodNEC CORP·Filed 1999·Granted May 15, 2001·19 cites·14 claims
- 0848US2010107568A1Method and apparatus for heat-sealing containerTOYO SEIKAN KAISHA LTD·Filed 2007·Application pending·0 cites
- 0947US11214247B2Vehicle control deviceTOYOTA MOTOR CO LTD·Filed 2020·Granted Jan 4, 2022·0 cites·5 claims
- 1045US6139409AWafer polishing apparatus and backing pad for wafer polishingNEC CORP·Filed 1999·Granted Oct 31, 2000·12 cites·13 claims
- 1138US6234884B1Semiconductor wafer polishing device for removing a surface unevenness of a semiconductor substrateNEC CORP·Filed 1999·Granted May 22, 2001·7 cites·5 claims
- 1231US5641231ATemperature monitoring apparatus equipped with gas chamber for converting temperature to gas pressureNEC CORP·Filed 1995·Granted Jun 24, 1997·4 cites·12 claims
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