Inventor · disambiguated record
Phillip J. Nigh
Also filed as: NIGH PHILLIP · NIGH PHILLIP J
19 granted patents·620 citations·filing 1990–2008
95Inventor score
Top patents by PatentIndex Score
19 records- 0194US5025344ABuilt-in current testing of integrated circuitsUNIV CARNEGIE MELLON·Filed 1990·Granted Jun 18, 1991·121 cites·17 claims
- 0292US6961886B2Diagnostic method for structural scan chain designsIBM·Filed 2003·Granted Nov 1, 2005·59 cites·19 claims
- 0392US6618682B2Method for test optimization using historical and actual fabrication test dataIBM·Filed 2001·Granted Sep 9, 2003·88 cites·16 claims
- 0491US6516432B1AC scan diagnostic methodIBM·Filed 1999·Granted Feb 4, 2003·103 cites·16 claims
- 0591US6442723B1Logic built-in self test selective signature generationIBM·Filed 1999·Granted Aug 27, 2002·84 cites·24 claims
- 0684US7574644B2Functional pattern logic diagnostic methodIBM·Filed 2005·Granted Aug 11, 2009·15 cites·5 claims
- 0780US7194706B2Designing scan chains with specific parameter sensitivities to identify process defectsIBM·Filed 2004·Granted Mar 20, 2007·24 cites·26 claims
- 0877US5930270ALogic built in self-test diagnostic methodIBM·Filed 1997·Granted Jul 27, 1999·41 cites·26 claims
- 0973US7017095B2Functional pattern logic diagnostic methodIBM·Filed 2002·Granted Mar 21, 2006·15 cites·6 claims
- 1070US6998866B1Circuit and method for monitoring defectsIBM·Filed 2004·Granted Feb 14, 2006·13 cites·30 claims
- 1160US8176362B2Online multiprocessor system reliability defect testingDENNEAU MONTY M·Filed 2008·Granted May 8, 2012·2 cites·15 claims
- 1258US6751765B1Method and system for determining repeatable yield detractors of integrated circuitsIBM·Filed 2000·Granted Jun 15, 2004·10 cites·10 claims
- 1358US6650768B1Using time resolved light emission from VLSI circuit devices for navigation on complex systemsIBM·Filed 1998·Granted Nov 18, 2003·20 cites·20 claims
- 1455US7127690B2Method and system for defect evaluation using quiescent power plane current (IDDQ) voltage linearityIBM·Filed 2003·Granted Oct 24, 2006·6 cites·18 claims
- 1542US6650130B1Integrated circuit device defect detection method and apparatus employing light emission imagingIBM·Filed 1999·Granted Nov 18, 2003·12 cites·9 claims
- 1638US7089514B2Defect diagnosis for semiconductor integrated circuitsIBM·Filed 2004·Granted Aug 8, 2006·1 cites·20 claims
- 1736US6125461AMethod for identifying long paths in integrated circuitsIBM·Filed 1998·Granted Sep 26, 2000·6 cites·14 claims
- 1835US6763314B2AC defect detection and failure avoidance power up and diagnostic systemIBM·Filed 2001·Granted Jul 13, 2004·0 cites·16 claims
- 1930US6269461B1Testing method for dynamic logic keeper deviceIBM·Filed 1998·Granted Jul 31, 2001·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →