Inventor · disambiguated record
Masashi Iwatsuki
Also filed as: IWATSUKI MASASHI
4 granted patents·52 citations·filing 1988–2017
75Inventor score
Top patents by PatentIndex Score
4 records- 0182US7095024B2TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscopeJEOL LTD·Filed 2004·Granted Aug 22, 2006·22 cites·9 claims
- 0253US4894538AScanning device for scanning tunneling microscopeJEOL LTD·Filed 1988·Granted Jan 16, 1990·16 cites·4 claims
- 0346US5128544AScanning probe microscopeJEOL LTD·Filed 1991·Granted Jul 7, 1992·14 cites·4 claims
- 0435US9972705B2Method for manufacturing semiconductor deviceDENSO CORP·Filed 2017·Granted May 15, 2018·0 cites·8 claims
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