Inventor · disambiguated record
John Kenneth Arch
Also filed as: ARCH JOHN · ARCH JOHN K · ARCH JOHN KENNETH
13 granted patents·6 pending applications·235 citations·filing 1998–2024
90Inventor score
Files withTEXAS INSTRUMENTS INC18
Top patents by PatentIndex Score
19 records- 0194US6236101B1Metallization outside protective overcoat for improved capacitors and inductorsTEXAS INSTRUMENTS INC·Filed 1998·Granted May 22, 2001·180 cites·10 claims
- 0292US10186576B2Device isolator with reduced parasitic capacitanceTEXAS INSTRUMENTS INC·Filed 2017·Granted Jan 22, 2019·6 cites·16 claims
- 0385US11587864B2Stacked capacitorTEXAS INSTRUMENTS INC·Filed 2021·Granted Feb 21, 2023·1 cites·16 claims
- 0485US9806148B2Device isolator with reduced parasitic capacitanceTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 31, 2017·3 cites·16 claims
- 0582US11222841B2Stacked capacitorTEXAS INSTRUMENTS INC·Filed 2019·Granted Jan 11, 2022·3 cites·14 claims
- 0680US11101342B1Deep trench intersectionsTEXAS INSTRUMENTS INC·Filed 2020·Granted Aug 24, 2021·1 cites·23 claims
- 0779US2025133780A1Deep trench intersectionsTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 0878US11107883B2Device isolator with reduced parasitic capacitanceTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 31, 2021·1 cites·20 claims
- 0978US6284617B1Metalization outside protective overcoat for improved capacitors and inductorsTEXAS INSTRUMENTS INC·Filed 2001·Granted Sep 4, 2001·23 cites·1 claims
- 1075US11869933B2Device isolator with reduced parasitic capacitanceTEXAS INSTRUMENTS INC·Filed 2021·Granted Jan 9, 2024·0 cites·20 claims
- 1169US12218188B2Deep trench intersectionsTEXAS INSTRUMENTS INC·Filed 2021·Granted Feb 4, 2025·0 cites·20 claims
- 1260US7112953B2Method for detecting epitaxial (EPI) induced buried layer shifts in semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2005·Granted Sep 26, 2006·1 cites·31 claims
- 1357US2025212442A1Integrated circuit (ic) with corrugated channel structures having vertically separated source and body contact regionsTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 1456US2024290641A1Electrical characterization of misalignment in integrated circuit manufacturingTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 1556US2025140560A1Integrated circuit (ic) with corrugated channel structureTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 1654US6284669B1Power transistor with silicided gate and contactsTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 4, 2001·16 cites·4 claims
- 1748US11626317B2Deep trench isolation with segmented deep trenchTEXAS INSTRUMENTS INC·Filed 2020·Granted Apr 11, 2023·0 cites·18 claims
- 1836US2004150065A1Field oxide profile of an isolation region associated with a contact structure of a semiconductor deviceFiled 2004·Application pending·0 cites
- 1936US2004007755A1Field oxide profile of an isolation region associated with a contact structure of a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 2002·Application pending·0 cites
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