Inventor · disambiguated record
Marcus Johannes Van Der Lans
Also filed as: VAN DER LANS MARCUS JOHANNES
3 granted patents·2 pending applications·1 citations·filing 2016–2024
46Inventor score
Files withASML NETHERLANDS BV2TNO2NEDERLANDSE ORGANISATIE VOOR TOEGEPAST NATUUWETENSCHAPPELIJK ONDERZOEK TNO1
Top patents by PatentIndex Score
5 records- 0163US2024160110A1Systems and methods for distributing light deliveryASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0263US2024329548A1Systems and methods for thermally stable mounting of optical columnsASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0347US11635448B2Heterodyne scanning probe microscopy method and scanning probe microscopy systemTNO·Filed 2020·Granted Apr 25, 2023·0 cites·16 claims
- 0443US11035878B2Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy systemTNO·Filed 2018·Granted Jun 15, 2021·0 cites·14 claims
- 0533US10480910B2Integrated circuit initiator deviceNEDERLANDSE ORGANISATIE VOOR TOEGEPAST NATUUWETENSCHAPPELIJK ONDERZOEK TNO·Filed 2016·Granted Nov 19, 2019·1 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →