Inventor · disambiguated record
Tang-Hsuan Chung
Also filed as: CHUNG TANG-HSUAN
7 granted patents·11 citations·filing 2011–2019
78Inventor score
Top patents by PatentIndex Score
7 records- 0172US10520545B2Method and apparatus for testing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 31, 2019·1 cites·7 claims
- 0272US8531201B2Method and apparatus for testing a semiconductor deviceSHAO JHIH-JIE·Filed 2011·Granted Sep 10, 2013·3 cites·20 claims
- 0371US9459316B2Method and apparatus for testing a semiconductor deviceHUANG SZU-CHIA·Filed 2011·Granted Oct 4, 2016·3 cites·18 claims
- 0471US9075101B2Method and apparatus for testing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 7, 2015·2 cites·20 claims
- 0567US11150296B2Method and apparatus for testing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 19, 2021·0 cites·20 claims
- 0661US9151798B2Method and apparatus for testing a semiconductor deviceSHAO JHIH JIE·Filed 2011·Granted Oct 6, 2015·2 cites·20 claims
- 0733US10020312B2Static random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 10, 2018·0 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →