Inventor · disambiguated record
Tae-Hung Ku
Also filed as: KU TAE-HUNG
23 granted patents·101 citations·filing 2006–2011
94Inventor score
Top patents by PatentIndex Score
23 records- 0192US7954869B2Pick and place apparatusTECHWING CO LTD·Filed 2006·Granted Jun 7, 2011·23 cites·18 claims
- 0292US7948255B2Test handlerTECHWING CO LTD·Filed 2006·Granted May 24, 2011·18 cites·3 claims
- 0387US8038191B2Pick and place apparatusTECHWING CO LTD·Filed 2008·Granted Oct 18, 2011·13 cites·9 claims
- 0480US7538542B2Test handler and operation method thereofTECHWING CO LTD·Filed 2006·Granted May 26, 2009·6 cites·9 claims
- 0575US7667453B2Test tray for test handlerTECHWING CO LTD·Filed 2008·Granted Feb 23, 2010·2 cites·14 claims
- 0674US7557564B2Test handler comprising at least one opening unit opening one part of the plurality of insertsTECHWING CO LTD·Filed 2007·Granted Jul 7, 2009·4 cites·10 claims
- 0773US8496113B2Insert for carrier board of test handlerNA YUN-SUNG·Filed 2008·Granted Jul 30, 2013·7 cites·2 claims
- 0870US8258804B2Test tray for test handlerSHIM JAE-GYUN·Filed 2007·Granted Sep 4, 2012·3 cites·7 claims
- 0969US8376431B2Pick-and-place module for test handlerTECHWING CO LTD·Filed 2010·Granted Feb 19, 2013·3 cites·5 claims
- 1069US7656150B2Test handler and loading method thereofTECHWING CO LTD·Filed 2007·Granted Feb 2, 2010·5 cites·7 claims
- 1168US8277162B2Unit for opening insert for test tray and method of mounting semiconductor device using the sameNA YUN SUNG·Filed 2009·Granted Oct 2, 2012·3 cites·11 claims
- 1267US8026735B2Test handlerTECHWING CO LTD·Filed 2009·Granted Sep 27, 2011·2 cites·2 claims
- 1366US7741836B2Test tray transferring apparatus for a test handler, test handler, and method of transferring test trays for a test handlerTECHWING CO LTD·Filed 2008·Granted Jun 22, 2010·3 cites·7 claims
- 1466US7723981B2Method for transferring test trays in a side-docking type test handlerTECHWING CO LTD·Filed 2009·Granted May 25, 2010·2 cites·7 claims
- 1564US8653845B2Test handler and method for operating the same for testing semiconductor devicesSHIM JAE-GYUN·Filed 2011·Granted Feb 18, 2014·1 cites·3 claims
- 1664US7898271B2Position changing apparatus for test handler and power transferring apparatusTECHWING CO LTD·Filed 2009·Granted Mar 1, 2011·1 cites·10 claims
- 1762US8013620B2Test handler and loading method thereofTECHWING CO LTD·Filed 2009·Granted Sep 6, 2011·3 cites·3 claims
- 1858US7923989B2Test handlerTECHWING CO LTD·Filed 2008·Granted Apr 12, 2011·2 cites·6 claims
- 1951US8159252B2Test handler and method for operating the same for testing semiconductor devicesSHIM JAE-GYUN·Filed 2007·Granted Apr 17, 2012·0 cites·3 claims
- 2049US8058890B2Test HandlerSHIM JAE-GYUN·Filed 2011·Granted Nov 15, 2011·0 cites·2 claims
- 2143US8333083B2System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the systemNA YUN-SUNG·Filed 2009·Granted Dec 18, 2012·0 cites·12 claims
- 2238US8558569B2Opener for test handlerNA YUN-SUNG·Filed 2011·Granted Oct 15, 2013·0 cites·2 claims
- 2331US8919755B2Hi-fix board clamping apparatus for use in test handlerSHIM JAE GYUN·Filed 2007·Granted Dec 30, 2014·0 cites·3 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →