Inventor · disambiguated record
Shuji Yamaoka
Also filed as: YAMAOKA SHUJI
23 granted patents·5 pending applications·277 citations·filing 2000–2004
95Inventor score
Top patents by PatentIndex Score
28 records- 0193US6825673B1Method and apparatus for circuit board continuity test, tool for continuity test, and recording mediumOHT INC·Filed 2000·Granted Nov 30, 2004·64 cites·22 claims
- 0289US7173445B2Sensor for inspection instrument and inspection instrumentOHT INC·Filed 2002·Granted Feb 6, 2007·62 cites·8 claims
- 0377US6710607B2Method and apparatus for inspectionOHT INC·Filed 2001·Granted Mar 23, 2004·22 cites·11 claims
- 0473US6921892B2Electrostatic imagerVARIAN MED SYS INC·Filed 2002·Granted Jul 26, 2005·17 cites·62 claims
- 0570US6703849B2Inspection apparatus, inspection method and inspection unit thereforOHT INC·Filed 2001·Granted Mar 9, 2004·15 cites·17 claims
- 0669US6614250B1Sensor probe for use in board inspection and manufacturing method thereofOHT INC·Filed 2000·Granted Sep 2, 2003·12 cites·11 claims
- 0766US6842026B2Inspecting apparatus and inspecting method for circuit boardOHT INC·Filed 2001·Granted Jan 11, 2005·9 cites·27 claims
- 0865US7138805B2Device and method for inspectionOHT INC·Filed 2001·Granted Nov 21, 2006·10 cites·9 claims
- 0962US6958619B2Inspecting apparatus and inspecting method for circuit boardOHT INC·Filed 2001·Granted Oct 25, 2005·7 cites·33 claims
- 1062US6734692B2Inspection apparatus and sensorOHT INC·Filed 2001·Granted May 11, 2004·11 cites·14 claims
- 1161US6995566B2Circuit pattern inspection apparatus, circuit pattern inspection method, and recording mediumOHT INC·Filed 2002·Granted Feb 7, 2006·10 cites·10 claims
- 1256US6947853B2Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereonOHT INC·Filed 2004·Granted Sep 20, 2005·7 cites·20 claims
- 1354US6943559B2Circuit pattern inspection device, circuit pattern inspection method, and recording mediumOHT INC·Filed 2002·Granted Sep 13, 2005·6 cites·18 claims
- 1451US6967498B2Apparatus and method for inspecting electronic circuitsOHT INC·Filed 2003·Granted Nov 22, 2005·4 cites·16 claims
- 1550US6972573B2Device and method for inspecting circuit boardOHT INC·Filed 2001·Granted Dec 6, 2005·5 cites·7 claims
- 1648US7495452B2Wire harness checker and wire harness checking methodSUMITOMO WIRING SYSTEMS·Filed 2004·Granted Feb 24, 2009·4 cites·5 claims
- 1747US7239127B2Apparatus and method for inspecting electronic circuitsOHT INC·Filed 2003·Granted Jul 3, 2007·3 cites·27 claims
- 1844US7088107B2Circuit pattern inspection instrument and pattern inspection methodOHT INC·Filed 2003·Granted Aug 8, 2006·4 cites·9 claims
- 1942US7026870B2Low-noise active RC signal processing circuitOHT INC·Filed 2002·Granted Apr 11, 2006·4 cites·6 claims
- 2040US7332914B2Conductor inspection apparatus and conductor inspection methodOHT INC·Filed 2004·Granted Feb 19, 2008·1 cites·8 claims
- 2136US6992493B2Device and method for substrate displacement detectionOHT INC·Filed 2002·Granted Jan 31, 2006·0 cites·10 claims
- 2235US6952104B2Inspection method and apparatus for testing fine pitch tracesOHT INC·Filed 2003·Granted Oct 4, 2005·0 cites·8 claims
- 2335US6933740B2Electronic circuit inspection sensor and inspection system using sameOHT INC·Filed 2003·Granted Aug 23, 2005·0 cites·9 claims
- 2434US2007073512A1Conductior position inspection apparatus and conductor position inspection methodYAMAOKA SHUJI·Filed 2004·Application pending·0 cites
- 2532US2004243345A1Tester and testing methodOHT INC·Filed 2002·Application pending·0 cites
- 2631US2004234121A1Circuit wiring inspetion instrument and circuit wiring inspecting methodFiled 2002·Application pending·0 cites
- 2731US2004240724A1Tester and testing methodFiled 2002·Application pending·0 cites
- 2830US2006043153A1Circuit pattern inspection device and circuit pattern inspection methodYAMAOKA SHUJI·Filed 2003·Application pending·0 cites
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