Inventor · disambiguated record
Won-Je Park
Also filed as: PARK WON-JE
18 granted patents·6 pending applications·85 citations·filing 2005–2023
93Inventor score
Top patents by PatentIndex Score
24 records- 0188US7598136B2Image sensor and related fabrication methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 6, 2009·11 cites·3 claims
- 0285US8138530B2CMOS image sensor having a crosstalk prevention structurePARK WON-JE·Filed 2009·Granted Mar 20, 2012·15 cites·3 claims
- 0384US7687837B2Image sensor and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 30, 2010·8 cites·15 claims
- 0484US7667178B2Image sensor, method of manufacturing the same, and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 23, 2010·9 cites·21 claims
- 0583US7955924B2Image sensor and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 7, 2011·8 cites·10 claims
- 0681US7932120B2Methods of manufacturing CMOS image sensorsSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Apr 26, 2011·6 cites·8 claims
- 0779US8354292B2CMOS image sensor having a crosstalk prevention structure and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Jan 15, 2013·2 cites·8 claims
- 0879US7875488B2Method of fabricating image sensor having inner lensSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jan 25, 2011·5 cites·17 claims
- 0979US7462520B2Methods of fabricating an image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 9, 2008·5 cites·22 claims
- 1074US7994551B2Image sensor and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 9, 2011·3 cites·23 claims
- 1174US7772624B2Image sensors and methods of fabricating sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 10, 2010·3 cites·14 claims
- 1271US7927902B2Methods of fabricating image sensors and image sensors fabricated therebySAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 19, 2011·2 cites·13 claims
- 1370US7973346B2Image sensor with self-boosting transfer transistor gate and methods of operating and fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 5, 2011·4 cites·6 claims
- 1460US2024096921A1Semiconductor device having stacked structure and method for manufacturing the sameSK HYNIX INC·Filed 2023·Application pending·0 cites
- 1558US8624310B2Image sensors with lightly doped drain (LDD) to reduce dark currentPARK WON-JE·Filed 2011·Granted Jan 7, 2014·0 cites·9 claims
- 1656US7335317B2Method of preparing polymer composite using unidirectionally solidified giant magnetostrictive materialKOREA ADVANCED INST SCI & TECH·Filed 2005·Granted Feb 26, 2008·4 cites·24 claims
- 1755US2023133670A1Image sensing deviceSK HYNIX INC·Filed 2022·Application pending·0 cites
- 1854US8309996B2CMOS image sensorsKIM UI-SIK·Filed 2011·Granted Nov 13, 2012·0 cites·8 claims
- 1951US2012001241A1CMOS Image Sensor Including PNP Triple Layer And Method Of Fabricating The CMOS Image SensorPARK WON-JE·Filed 2011·Application pending·0 cites
- 2049US2009045479A1Image sensor with vertical drain structuresBAE JEONG-HOON·Filed 2008·Application pending·0 cites
- 2148US7586140B2CMOS image sensors including pickup regionsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 8, 2009·0 cites·14 claims
- 2246US2005274995A1Image sensor and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 2346US2011204468A1Image sensor and method of manufacturing the sameSONG JAE-HO·Filed 2011·Application pending·0 cites
- 2437US8143142B2Method of fabricating epi-wafer, epi-wafer fabricated by the method, and image sensor fabricated using the epi-waferPARK YOUNG-SOO·Filed 2010·Granted Mar 27, 2012·0 cites·12 claims
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