Inventor · disambiguated record
Tatsushi Higashi
Also filed as: HIGASHI TATSUSHI
3 granted patents·63 citations·filing 1998–2001
70Inventor score
Files withMITSUBISHI ELECTRIC CORP3
Top patents by PatentIndex Score
3 records- 0174US5932891ASemiconductor device with test terminal and IC socketMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 3, 1999·52 cites·10 claims
- 0238US6589063B2Electric contact device for establishing an improved contact with contactors of other deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 8, 2003·2 cites·16 claims
- 0338US6151695ATest method of chips in a semiconductor wafer employing a test algorithmMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 21, 2000·9 cites·8 claims
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