Inventor · disambiguated record
Yuzo Taniguchi
Also filed as: TANIGUCHI YUZO
19 granted patents·1 pending application·780 citations·filing 1975–2002
96Inventor score
Files withHITACHI LTD19
Top patents by PatentIndex Score
20 records- 0195US6471115B1Process for manufacturing electronic circuit devicesHITACHI LTD·Filed 2000·Granted Oct 29, 2002·91 cites·4 claims
- 0294US5274434AMethod and apparatus for inspecting foreign particles on real time basis in semiconductor mass production lineHITACHI LTD·Filed 1991·Granted Dec 28, 1993·218 cites·20 claims
- 0388US6249242B1High-frequency transmitter-receiver apparatus for such an application as vehicle-onboard radar systemHITACHI LTD·Filed 1999·Granted Jun 19, 2001·103 cites·37 claims
- 0487US5841893AInspection data analyzing systemHITACHI LTD·Filed 1992·Granted Nov 24, 1998·76 cites·12 claims
- 0582US4731855APattern defect inspection apparatusHITACHI LTD·Filed 1985·Granted Mar 15, 1988·74 cites·13 claims
- 0681US6346772B1Wiring substrate and gas discharge display device that includes a dry etched layer wet-etched first or second electrodesHITACHI LTD·Filed 2001·Granted Feb 12, 2002·13 cites·3 claims
- 0778US5173719AMethod and apparatus for the inspection of patternsHITACHI LTD·Filed 1990·Granted Dec 22, 1992·63 cites·17 claims
- 0875US6343967B1Method of making gas discharge display panel and gas discharge display deviceHITACHI LTD·Filed 2001·Granted Feb 5, 2002·9 cites·16 claims
- 0974US6621217B2Wiring substrate and gas discharge display deviceHITACHI LTD·Filed 2002·Granted Sep 16, 2003·8 cites·5 claims
- 1074US6330352B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Dec 11, 2001·11 cites·2 claims
- 1172US6628817B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Sep 30, 2003·9 cites·25 claims
- 1271US6529619B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Mar 4, 2003·9 cites·3 claims
- 1370US6650409B1Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same systemHITACHI LTD·Filed 1996·Granted Nov 18, 2003·39 cites·49 claims
- 1468US6339653B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Jan 15, 2002·7 cites·12 claims
- 1559US6185322B1Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic deviceHITACHI LTD·Filed 1997·Granted Feb 6, 2001·15 cites·14 claims
- 1657US6261144B1Wiring substrate and gas discharge display device and method thereforHITACHI LTD·Filed 1998·Granted Jul 17, 2001·14 cites·24 claims
- 1753US4019669AWire bonding apparatusHITACHI LTD·Filed 1975·Granted Apr 26, 1977·14 cites·10 claims
- 1851US6429586B1Gas discharge display panel and gas discharge display device having electrodes formed by laser processingHITACHI LTD·Filed 1999·Granted Aug 6, 2002·7 cites·17 claims
- 1943US6624575B2Method of making gas discharge display panel and gas discharge display deviceHITACHI LTD·Filed 2002·Granted Sep 23, 2003·0 cites·6 claims
- 2041US2002034326A1Inspection data analyzing systemFiled 2001·Application pending·0 cites
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