Inventor · disambiguated record
Hiroto Nagatomo
Also filed as: NAGATOMO HIROTO
11 granted patents·2 pending applications·593 citations·filing 1979–2001
93Inventor score
Files withHITACHI LTD11
Top patents by PatentIndex Score
13 records- 0194US5536128AMethod and apparatus for carrying a variety of productsHITACHI LTD·Filed 1993·Granted Jul 16, 1996·250 cites·4 claims
- 0287US5841893AInspection data analyzing systemHITACHI LTD·Filed 1992·Granted Nov 24, 1998·76 cites·12 claims
- 0385US4342515AMethod of inspecting the surface of an object and apparatus thereforHITACHI LTD·Filed 1979·Granted Aug 3, 1982·44 cites·6 claims
- 0482US4731855APattern defect inspection apparatusHITACHI LTD·Filed 1985·Granted Mar 15, 1988·74 cites·13 claims
- 0579US4544318AManufacturing systemHITACHI LTD·Filed 1983·Granted Oct 1, 1985·53 cites·6 claims
- 0679US4282825ASurface treatment deviceHITACHI LTD·Filed 1979·Granted Aug 11, 1981·45 cites·27 claims
- 0774US6330352B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Dec 11, 2001·11 cites·2 claims
- 0872US6628817B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Sep 30, 2003·9 cites·25 claims
- 0971US6529619B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Mar 4, 2003·9 cites·3 claims
- 1068US6339653B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Jan 15, 2002·7 cites·12 claims
- 1159US6185322B1Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic deviceHITACHI LTD·Filed 1997·Granted Feb 6, 2001·15 cites·14 claims
- 1241US2002034326A1Inspection data analyzing systemFiled 2001·Application pending·0 cites
- 1335US2002064440A1Production line constructing systemFiled 2001·Application pending·0 cites
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