Inventor · disambiguated record
Yun Hi Lee
Also filed as: LEE YUN HI
12 granted patents·1 pending application·251 citations·filing 1996–2008
91Inventor score
Files withKOREA INST SCI & TECH8LG ELECTRONICS INC2BYUN SANG-MYUNG1KOREA INTSTITUTE OF SCIENCE AN1LEE YUN-HI1
Top patents by PatentIndex Score
13 records- 0193US6833558B2Parallel and selective growth method of carbon nanotube on the substrates for electronic-spintronic device applicationsKOREA INST SCI & TECH·Filed 2001·Granted Dec 21, 2004·144 cites·16 claims
- 0280US8342825B22 stage rotary compressorLG ELECTRONICS INC·Filed 2008·Granted Jan 1, 2013·7 cites·20 claims
- 0369US8430656B22 stage rotary compressorBYUN SANG-MYUNG·Filed 2008·Granted Apr 30, 2013·4 cites·17 claims
- 0468US5955835AWhite-light emitting electroluminescent display device and manufacturing method thereofKOREA INST SCI & TECH·Filed 1996·Granted Sep 21, 1999·35 cites·12 claims
- 0567US5977703AField emission display deviceKOREA INST SCI & TECH·Filed 1996·Granted Nov 2, 1999·20 cites·6 claims
- 0661US6808605B2Fabrication method of metallic nanowiresKOREA INST SCI & TECH·Filed 2002·Granted Oct 26, 2004·8 cites·9 claims
- 0759US6121066AMethod for fabricating a field emission displayKOREA INST SCI & TECH·Filed 1996·Granted Sep 19, 2000·14 cites·4 claims
- 0843US5912532AWhite-light emitting electroluminescent display and fabricating method thereofKOREA INST SCI & TECH·Filed 1996·Granted Jun 15, 1999·11 cites·6 claims
- 0940US8272847B2Reciprocating compressorLEE YUN-HI·Filed 2008·Granted Sep 25, 2012·0 cites·4 claims
- 1034US5966588AField emission display device fabrication methodKOREA INST SCI & TECH·Filed 1996·Granted Oct 12, 1999·4 cites·22 claims
- 1133US5853795ALuminant for field emission display fabricated through physical vapor deposition and method for fabricating the sameKOREA INST SCI & TECH·Filed 1996·Granted Dec 29, 1998·2 cites·15 claims
- 1230US2009151371A1Power saving type compressor and refrigerator with the same and method for controlling the sameLG ELECTRONICS INC·Filed 2006·Application pending·0 cites
- 1322US5814528AFabrication method of semiconductor test pieceKOREA INTSTITUTE OF SCIENCE AN·Filed 1996·Granted Sep 29, 1998·2 cites·4 claims
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